Published online by Cambridge University Press: 26 February 2011
Intentionally contaminated DC and microwave plasma deposited diamond films were used to evaluate the characterization capability of SIMS, TXRF and RBS for heavy metal measurements. The results showed SIMS is the preferred analytical technique for heavy metal impurities in the diamond films, and TXRF for the top surface analysis of the substrate and pre-processed substrate. In addition TXRF may provide a quick, non-destructive qualitative characterization of the diamond film surface and bulk. The RBS can provide qualitative and quantitative information if the impurity levels are high enough (above 1013 atoms/cm2).