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Characterization of Grain Boundaries in Electronic Ceramics by Transmission Electron Microscopy

Published online by Cambridge University Press:  15 February 2011

David R. Clarke
David R. Clarke*
Affiliation:
Rockwell International Science CenterThousand Oaks, CA 91360
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Abstract

The principal high resolution transmission electron microscopy techniques used in characterizing grain boundaries in electronic ceramics are described, including those recently developed for detecting the presence of extremely thin (∼10Å) intergranular phases. The capabilities of the techniques are illustrated with examples drawn from studies of ZnO varistors, PTC BaTiO3 devices and boundary layer capacitors.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 5: Symposium B – Grain Boundaries in Semiconductors , 1981 , 3
Copyright
Copyright © Materials Research Society 1982

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References

REFERENCES

1. Krivanek, O. L., Isoda, S. and Kobayashi, K., Philos. Mag. 36, 931 (1977).Google Scholar
2. Spence, J. C. P., Experimental High Resolution Electron Microscopy (Oxford University Press, 1981).CrossRefGoogle Scholar
3. Clarke, D. R., J. Appl. Phys. 49, 2407 (1978).Google Scholar
4. Clarke, D. R., J. Am. Ceram. Soc. 62, 236 (1979).Google Scholar
5. Clarke, D. R., Ultramicroscopy 4, 33 (1979).Google Scholar
6. Sinclair, R. and Thomas, G., Met. Trans 9A, 373 (1978).Google Scholar
7. Clarke, D. R., SEM I, 1978, p. 77.Google Scholar
8. Allpress, J. G. and Sanders, J. V., J. Appl. Crystallogr. 6, 165 (1973).Google Scholar
9. Ruhle, M., Springer, C., Gauckler, L. J. and Wilkens, M., Proc. 5th Int. Conf. High Voltage Electron Microscopy, edited T. Mura and H. Hashimoto (1977).Google Scholar
10. Clarke, D. R., J. Am. Ceram. Soc. 63, 104 (1980).CrossRefGoogle Scholar
11. Heidenreich, R. D., Fundamentals of Transmission Electron Microscopy (Wiley-Interscience, New York, 1964).Google Scholar
12. Matsuoka, M., Jap. J. Appl. Phys. 10, 736 (1971).CrossRefGoogle Scholar
13. Clarke, D. R., J. Appl. Phys. 50, 6829 (1979).Google Scholar
14. Kingery, W. D., Vander-Sande, J. B. and Mitamura, T., J. Am. Ceramic. Soc. 62, 221 (1979).Google Scholar
15. Morris, W. G. and Cahn, J. W., in Grain Boundaries in Engineering Materials, edited J. W. Walters, et al.Google Scholar
16. Bongers, P. F. and Franken, P. E. C., Advances in Ceramics 1, 38 (1981).Google Scholar
17. Payne, D. A. and Cross, L. E., to be published.Google Scholar
18. Clarke, D. R. and Cross, L. E., to be published.Google Scholar