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Characterization of Cross-Sections of Tibacacuo Thin Films on Ceramic Substrates by Analytical and High Resolution Electron Microscopy

Published online by Cambridge University Press:  28 February 2011

J. Mayer ,
M. Lanham ,
T.W. James ,
A.G. Evans  and
M. RÜHle
J. Mayer
Affiliation:
Materials Department, University of California, Santa Barbara, CA 93106
M. Lanham
Affiliation:
Materials Department, University of California, Santa Barbara, CA 93106
T.W. James
Affiliation:
Superconductor Technologies Inc., 460 Ward Drive, Santa Barbara, CA 93111
A.G. Evans
Affiliation:
Materials Department, University of California, Santa Barbara, CA 93106
M. RÜHle
Affiliation:
now at: Max-Planck-Institut für Metallforschung, D-7000 Stuttgart 1, Federal Republic of Germany.
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Abstract

Cross-sectioned TEM specimens of thin TIBaCaCuO superconducting films on MgO and LaAlO3 substrates have been obtained using special ceramic holders. The superconductor/substrate interface as well as grain boundaries and defects in the superconductor have been characterized by means of analytical and high-resolution electron microscopy. EDX analysis and lattice images confirm that interdiffusion and the formation of an amorphous layer takes place at the interface between the LaA1O3 substrate and the superconducting film, while no indication for such reactions has been found in the case of the MgO substrates. The presence of intergrowth and defects in the superconducting film have been demonstrated by high-resolution electron microscopy. The chemical nature of such defects has been determined by a quantitative evaluation of high-resolution micrographs.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 169: Symposium M – High Temperature Superconductors: Fundamental Properties and Novel Materials Processing , 1989 , 781
Copyright
Copyright © Materials Research Society 1990

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References

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