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Channeling Study of the Damage Induced in Ion-Irradiated Ceramic Oxides

Published online by Cambridge University Press:  01 February 2011

Lionel Thomé
Affiliation:
Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse, F-91405 Orsay, France
Aurélie Gentils
Affiliation:
Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse, F-91405 Orsay, France
Frédérico Garrido
Affiliation:
Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse, F-91405 Orsay, France
Jacek Jagielski
Affiliation:
Institute of Electronic Materials Technology, PL-01–919 Warsaw, Poland
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Abstract

The evaluation of the damage generated in crystalline ceramic oxides placed in a radiative environment is a major challenge in many technological domains. The use of the channeling technique is particularly well adapted to measure the depth distribution of the irradiation-induced disorder and to monitor the damage build-up. This paper describes the methodology used for the study of radiation damage with the channeling technique, presents a new method of analysis of channeling data based on Monte-Carlo simulations and provides recent results concerning the damage induced in ion-bombarded ceramic oxide single crystals in both nuclear (low-energy ion irradiation) and electronic (high-energy ion irradiation) slowing-down regimes.

Type
Research Article
Copyright
Copyright © Materials Research Society 2004

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