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Cello Measurements of CIGS and μcSi Solar Cells

Published online by Cambridge University Press:  01 February 2011

Stefan Mathijssen
Affiliation:
Chair for General Materials Science, Christian-Albrechts-University of Kiel, Kaiserstr. 2, D-24143 Kiel, Germany
Jürgen Carstensen
Affiliation:
Chair for General Materials Science, Christian-Albrechts-University of Kiel, Kaiserstr. 2, D-24143 Kiel, Germany
Helmut Föll
Affiliation:
Chair for General Materials Science, Christian-Albrechts-University of Kiel, Kaiserstr. 2, D-24143 Kiel, Germany
Georg Voorwinden
Affiliation:
ZSW Stuttgart, Industriestr. 6, D-70565 Stuttgart, Germany
Helmut Stiebig
Affiliation:
IPV, FZ Jülich, Leo-Brandt Str., D-52425 Jülich, Germany
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Abstract

The CELLO (solar celllocal characterization) technique, which allows to measure all parameters of a solar cell locally with high spatial resolution, is applied for the first time for thin film solar cells based on Cu(In,Ga)Se2 (CIGS) and micro-crystalline Si (μcSi). Results for local effective serial resistance, photocurrent and current/voltage at the working point will be presented, demonstrating the applicability of CELLO to thin film solar cells. Based on the measurements, quantitative predictions for the potential of these cells will be made.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

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References

[1] Carstensen, J., Popkirov, G., Bahr, J., and Föll, H., in Proceedings of the 16th European Photovoltaic Solar Energy Conference, VD3.35, Glasgow (2000).Google Scholar
[2] Carstensen, J., Popkirov, G., Bahr, J., and Föll, H., Solar Energy Materials & Solar Cells 76, 599 (2003).Google Scholar
[3] Voorwinden, G., Kniese, R., and Powalla, M.., Thin Solid Films 431-432, 538 (2003).Google Scholar
[4] Rech, B., Roschek, T., Repmann, T., Müller, J., Schmitz, R., and Appenzeller, W., Thin Solid Films 427, 157 (2003).Google Scholar
[5] Breitenstein, O., Langenkamp, M., Rakotoniaina, P., and Zettner, J., in Proc. 17th European Photovoltaic Solar Energy Conference and Exhibition, eds. McNelis, B., Palz, W., Ossenbrink, H.A., and Helm, P., 1499, Munich (2002).Google Scholar
[6] Huth, S., Breitenstein, O., Huber, A., Dantz, D., Lambert, U., and Altmann, F., Solid State Phenomena 82-84, 741 (2002).Google Scholar