Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-25T17:28:28.289Z Has data issue: false hasContentIssue false
  • English
  • Français

Cathodoluminescence Studies of InGaN Quantum Wells

Published online by Cambridge University Press:  10 February 2011

F. A. Ponce ,
S. A. Galloway ,
W. Goetz  and
R. S. Kern
F. A. Ponce
Affiliation:
Xerox Palo Alto Research Center, Palo Alto, CA 94304 ([email protected])
S. A. Galloway
Affiliation:
Oxford Instruments, Tubney Woods, Abingdon, Oxon OX13 5QX, U. K.
W. Goetz
Affiliation:
Hewlett-Packard Company, Optoelectronics Division, 370 W.Trimble Rd., San Jose, CA 95131
R. S. Kern
Affiliation:
Hewlett-Packard Company, Optoelectronics Division, 370 W.Trimble Rd., San Jose, CA 95131
Get access

Abstract

Low temperature cathodoluminescence has been used to investigate the spatial characteristics of light emission in InxGa1−xN single quantum wells. High spatial resolution, narrow band pass imaging shows the luminescence to be strongly inhomogeneous in wavelength as well as in intensity on a sub-micron scale. Cathodoluminescence spectra correlate favorably with photoluminescence spectra. However, when spectra are recorded from different areas in spot mode, the quantum emission varies significantly in wavelength. The observed variations are consistent with composition inhomogeneities in the quantum well.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 482 , 1997 , 625
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Nakamura, S., Mat. Res. Soc. Symp. Proc. 449, 1135 (1997).Google Scholar
2. Lester, S. D., Ponce, F. A., Craford, M. G., and Steigerwald, D. A., Appl. Phys. Lett. 66, 1249 (1995).Google Scholar
3. Ponce, F. A., Bour, D. P., Götz, W., and Wright, P. J., Appl. Phys. Lett. 68, 57 (1996).Google Scholar
4. Chichibu, S., Azuhata, T., Sota, T., and Nakamura, S., Appl. Phys. Lett. 69, 4188 (1996).Google Scholar
5. Narukawa, Y., Kawakami, Y., Fujita, S., Fujita, S., and Nakamura, S., Phys. Rev. B 55, R1938 (1997).Google Scholar
6. Lakner, H., Liu, Q., Brockt, G., Radefeld, A., Schulze-Kraasch, F., and Scholz, F., Mat. Res. Soc. Symp. Proc. 482, 351 (1998). These Proceedings.Google Scholar
7. Ponce, F. A., Cherns, D., Götz, W. and Kern, R. S., Mat. Res. Soc. Symp. Proc. 482, 453 (1998). These Proceedings.Google Scholar
8. Ponce, F. A., Young, W. T., Cherns, D., Steeds, J. W., and Nakamura, S., Mat. Res. Soc. Symp. Proc. 449, 405 (1997).Google Scholar
9. Liliental-Weber, Z., Chen, Y., Ruvimov, S., Swider, W., and Washburn, J., Mat. Res. Soc. Symp. Proc. 449, 417 (1997).Google Scholar
10. Liliental-Weber, Z., Ruvimov, S., Swider, W., Kim, Y., Washburn, J., Nakamura, S., Kern, R. S., Chen, Y. and Yang, J. W., Mat. Res. Soc. Symp. Proc. 482, 375 (1998). These Proceedings.Google Scholar
11. See e.g.: Yacobi, B. G. and Holt, D. B., Cathodoluminescence Microscopy of Inorganic Solids (1990, Plenum, New York), p. 58.Google Scholar