Hostname: page-component-6bf8c574d5-vmclg Total loading time: 0 Render date: 2025-02-18T06:36:23.063Z Has data issue: false hasContentIssue false
  • English
  • Français

Carrier-Concentration-Dependent Magnetic Properties of the Diluted Magnetic Semiconductor SnMnte

Published online by Cambridge University Press:  03 September 2012

H. J. M. Swagten ,
S. J. E. A. Eltink  and
W. J. M. De Jonge
H. J. M. Swagten
Affiliation:
Eindhoven University of Technology, Department of Physics, P.O. Box 513, 5600 MB Eindhoven, The Netherlands.
S. J. E. A. Eltink
Affiliation:
Eindhoven University of Technology, Department of Physics, P.O. Box 513, 5600 MB Eindhoven, The Netherlands.
W. J. M. De Jonge
Affiliation:
Eindhoven University of Technology, Department of Physics, P.O. Box 513, 5600 MB Eindhoven, The Netherlands.
Get access

Abstract

In this paper experimental evidence is presented for the carrier concentration dependence of the magnetic properties of Sn0.97Mn0.03Te, yielding a critical concentration above which ferromagnetic interactions are dominant. The observed behavior can be fairly well explained within a modified RKKY-model. Preliminary experiments on the low temperature magnetic phases indicate re-entrant spinglass behavior, which is qualitatively described with the spinglass model of Sherrington and Kirkpatrick.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 151: Symposium G – Growth, Characterization and Properties of Ultrathin Magnetic Films and Multilayers , 1989 , 171
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] for a recent review see: Furdyna, J.K., J. of Appl. Phys. 64 (4), R29 (1988).Google Scholar
[2] Story, T., Gałązka, R.R., Frankel, R.B. and Wolff, P.A., Phys. Rev. Lett. 56 (7), 777 (1986).Google Scholar
[3] Swagten, H.J.M., Hoek, H. v. d., de Jonge, W.J.M., Gałązka, R.R., Warmenbol, P. and Devreese, J.T. in Proceedings of the 19th International Conference on the Physics of Semiconductors, Warsaw (Poland), 1988.Google Scholar
[4] Swagten, H.J.M., de Jonge, W.J.M., Gałązka, R.R., Warmenbol, P. and Devreese, J.T., Phys. Rev. B 37, 9907 (1988); W.J.M. de Jonge, H.J.M. Swagten, R.R. Gałązka, P. Warmenbol and J.T. Devreese, IEEE trans. on magn. 24 (6), 2542 (1988).Google Scholar
[5] for some recent reports see: Mauger, A., Escorne, M., Phys. Rev. B 35, 1902 (1987); M. Escorne, A. Mauger, J.L. Tholence and R. Triboulet, Phys. Rev. B 29, 6306 (1984).Google Scholar
[6] Allgaier, R.S. and Houston, B., Phys. Rev. B, 2186 (1972).Google Scholar
[7] Inoue, M., Tanabe, M., Yagi, H. and Tatsukawa, T., J. of the Phys. Soc. of Japan 47 (6), 1879 (1979).Google Scholar
[8] Mathur, M.P., Deis, D.W., Jones, C.K., Patterson, A., Carr, W.J. and Miller, R.C., J. of Appl. Phys. 41 (3), 1005 (1970).CrossRefGoogle Scholar
[9] Sondermann, U., J. of Magn. and Magn. Mat. 2, 216 (1976).Google Scholar
[10] Escorne, M., Godinho, M., Tholence, J.L. and Mauger, A., J. of Appl. Phys. 57 (1), 3424 (1985).Google Scholar
[11] Nimtz, G. and Schlicht, B. in Narrow-Gap Semiconductors, edited by Hohler, G. (Springer-Verlag Berlin Heidelberg New York Tokyo 1983), p. 1–117.Google Scholar
[12] Verbeek, B.H., Nieuwenhuys, G.J., Stocker, H. and Mydosh, J.A., Phys. Rev. Lett. 4L (9), 586 (1978).Google Scholar
[13] Nieuwenhuys, G.J., Stocker, H., Verbeek, B.H. and Mydosh, J.A., Solid State Comm. 27, 197 (1978).Google Scholar
[14] Sherrington, D. and Kirkpatrick, S., Phys. Rev. Lett. 35 (26), 1792 (1975).CrossRefGoogle Scholar
[15] Karczewski, G., Wisniewski, A., Story, T., Baran, M. and Gałązka, R.R., Proceedings of the 19th International Conference on the Physics of Semiconductors, Warsaw (Poland), 1988.Google Scholar
[16] Coles, B.R., Phil. Mag. B 49 (1), L21 (1984).Google Scholar
[17] Chakrabarti, A. and Dasgupta, C., Phys. Rev. Lett. 56 (13), 1404 (1986).Google Scholar