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Carbonization and/or Nitridation of Titanium and Zirconium for Increasing Melting Temperature

Published online by Cambridge University Press:  10 February 2011

M. Nunogaki
Affiliation:
ISIR Osaka University, Ibaraki, Osaka 567-0047, Japan, [email protected]
Y. Susuki
Affiliation:
Department of Pysics, Osaka Kyoiku University, Kashiwara, Osaka 582-26, Japan.
K. Kitahama
Affiliation:
ISIR Osaka University, Ibaraki, Osaka 567-0047, Japan, [email protected]
Y Nakata
Affiliation:
ISIR Osaka University, Ibaraki, Osaka 567-0047, Japan, [email protected]
F Hori
Affiliation:
RIAST, Osaka Prefecture University, Sakai, Osaka 599-8570, Japan
R. Oshima
Affiliation:
RIAST, Osaka Prefecture University, Sakai, Osaka 599-8570, Japan
S. Emura
Affiliation:
ISIR Osaka University, Ibaraki, Osaka 567-0047, Japan, [email protected]
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Abstract

Samples of Ti and Zr metals have been carbonized or nitrided at high temperature by means of reactive plasma processing. Thickness and hardness of modified layers increased with the processing temperature and time in an experimental range below 1500°C for less 5h. The maximum hardness of TiC-layer modified at 1300°C for 3h was about 5000Hv(kg/mm2) and the maximum thickness of ZrC-layer formed at 1400°C for 5h reached about 100μm. A TiC-layer was analyzed with EPMA, XRD, EXAFS and PAS(Positron Annihilation Spectroscopy). It was confirmed that the sub-surface layer of Ti metal was the mixture of TiC ceramics and Ti metal, and that the thickness of TiC with NaCI type structure was very large.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

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References

1) Nunogaki, M., Suezawa, H and Miyazaki, K., Vacuum, 39,2-4, p.281(1989).Google Scholar
2) Nunogaki, M., Suezawa, H., Nishijima, S. and Okada, T. in Inin 'l Conf on Evolhtion in Becam Applications, (JAERI & IAEA, 1991), pp. 108111.Google Scholar
3) Edenhofer, B., Heat Treatment of Metals, 1(1974), pp.24.Google Scholar
4) , Flzumi, The Rietveld Method, (R-A. Young. Oxford University Press,. Oxford, 1993), Cap. 13.Google Scholar
5) Powder Diffraction file #32-1383, (International Center for Diffraction Data, 12, Campus Blvd. Newton. Sq. Pen. 19073-3273 USA).Google Scholar