Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-25T19:24:08.107Z Has data issue: false hasContentIssue false

Can Oxidation and Other Treatments Help Us Understand the Nature of Light-Emitting Porous Silicon?

Published online by Cambridge University Press:  25 February 2011

P.M. Fauchet
Affiliation:
Department of Electrical Engineering, University of Rochester, Rochester NY 14627
E. Ettedgui
Affiliation:
Department of Physics and Astronomy
A. Raisanen
Affiliation:
Xerox Webster Research Center, Webster, NY 14580
L.J. Brillson
Affiliation:
Xerox Webster Research Center, Webster, NY 14580
F. Seiferth
Affiliation:
Department of Microelectronic Engineering, Rochester Institute of Technology, Rochester NY 14623
S.K. Kurinec
Affiliation:
Department of Microelectronic Engineering, Rochester Institute of Technology, Rochester NY 14623
Y. Gao
Affiliation:
Department of Physics and Astronomy
C. Peng
Affiliation:
Department of Electrical Engineering, University of Rochester, Rochester NY 14627
L. Tsybeskov
Affiliation:
Department of Electrical Engineering, University of Rochester, Rochester NY 14627
Get access

Abstract

Using a careful analysis of the properties of light-emitting porous silicon (LEpSi), we conclude that a version of the “smart” quantum confinement model which was first proposed by F. Koch et al [Mat. Res. Soc. Symp. Proc. 283, 197 (1993)] and allows for the existence of surface states and dangling bonds, is compatible with experimental results. Among the new results we present in support of this model, the most striking ones concern the strong infrared photoluminescence that dominates the room temperature cw spectrum after vacuum annealing above 600 K.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

references

1. Canham, L.T., Appl. Phys. Lett. 57, 1046 (1990).Google Scholar
2. Lehmann, V. and Gosele, U., Appl. Phys. Lett. 58, 856 (1991).Google Scholar
3. Wolford, D.J., Reimer, J.A. and Scott, B.A., Appl. Phys. Lett. 42, 369 (1983).Google Scholar
4. Prokes, S.M., Phys. Rev. B 45, 13788 (1992).Google Scholar
5. Brandt, M.S., Solid State Commun. 81, 307 (1992).Google Scholar
6. Petrova-Koch, V., Appl. Phys. Lett. 61, 943 (1992).Google Scholar
7. Tsybeskov, L., “Comparative study of light-emitting porous silicon anodized with light assistance and in the dark”, Mat. Res. Soc. Symp. Proc. 298 (this volume)Google Scholar
8. Tischler, M.A. and Collins, R.T., Solid State Commun. 84, 819 (1992).Google Scholar
9. Koch, F., Mat. Res. Soc. Symp. Proc. 283, 197 (1993).Google Scholar
10. Cullis, A.G. and Canham, L.T., Nature 353, 335 (1991).Google Scholar
11. Sui, Z., Mat. Res. Soc. Symp. Proc. 256, 13 (1992).Google Scholar
12. Fauchet, P.M. and Campbell, I.H., Crit. Rev. Solid State Mater. Sci. 14, S79 (1988)Google Scholar
13. Badoz, P.A., Mat. Res. Soc. Symp. Proc. 283, 97 (1993). 276Google Scholar
14. Xie, Y.H., “Absorption and luminescence studies offree-standing porous silicon films”, presented at Symposium B of the Spring 1993 MRS meeting and to be publishedGoogle Scholar
15. Buuren, T. van, “X-ray photoelectron spectroscopy measurements on porous silicon”, presented at Symposium B of the Spring 1993 MRS meeting and to be publishedGoogle Scholar
16. for wires, see for example Sanders, G.D. and Chang, Y.-C., Phys. Rev. B 45, 9202 (1992). or A.J. Read et al, Phys. Rev. Lett. 69, 1232 (1992)Google Scholar
17. for clusters or dots, see for example Proot, J.P., Delerue, C. and Allan, G., Appl. Phys. Lett. 61, 1948 (1992). or M. Hirao, T. Uda and Y. Murayama, Mat. Res. Soc. Symp. Proc. 283, 425 (1993)Google Scholar
18. Peng, C., Tsybeskov, L. and Fauchet, P.M., Mat. Res. Soc. Symp. Proc. 283, 121 (1993).Google Scholar
19. Kovalev, D.I., “The fast and slow luminescence bands of oxidized porous Si”, to be publishedGoogle Scholar
20. Littau, K.A., J. Chem. Phys. 97, 1224 (1993).Google Scholar
21. Peng, C., “Light-emitting porous silicon after standard microelectronic processing”, Mat. Res. Soc. Symp. Proc. 298 (this volume)Google Scholar
22. Chen, X., Henderson, B. and O'Donnell, K.P., Appl. Phys. Lett. 60, 2672 (1992).Google Scholar
23. Li, K.-H., “The relationship between surface chemistry and photoluminescence of porous silicon”, Mat. Res. Soc. Symp. Proc. 298 (this volume)Google Scholar
24. Pickering, C., J. Phys. C:Solid State Phys. 17, 6535 (1984).Google Scholar
25. Perry, C.H., Mat. Res. Soc. Symp. Proc. 256, 153 (1992).Google Scholar