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Bright Contrast Imaging of Carbon Nanofiber-Substrate Interface using Scanning Electron Microscopy

Published online by Cambridge University Press:  01 February 2011

Makoto Suzuki ,
Yusuke Ominami ,
Quoc Ngo ,
Toshishige Yamada ,
Bill Roth ,
Mark Betts ,
Alan M. Cassell ,
Jun Li  and
Cary Y. Yang
Makoto Suzuki
Affiliation:
[email protected], Santa Clara University, Center for Nanostructures, 500 El Camino Real, Santa Clara, CA, 95129, United States, 408-554-6817, 408-554-5474
Yusuke Ominami
Affiliation:
[email protected], Santa Clara University, Center for Nanostructures, 500 El Camino Real, Santa Clara, CA, 95053, United States
Quoc Ngo
Affiliation:
[email protected], Santa Clara University, Center for Nanostructures, 500 El Camino Real, Santa Clara, CA, 95053, United States
Toshishige Yamada
Affiliation:
[email protected], NASA Ames Research Center, Moffett Field, CA, 94035, United States
Bill Roth
Affiliation:
[email protected], Hitachi High-Technologies America, Inc., 5100 Franklin Drive, Pleasanton, CA, 94588, United States
Mark Betts
Affiliation:
[email protected], Hitachi High-Technologies America, Inc., 5100 Franklin Drive, Pleasanton, CA, 94588, United States
Alan M. Cassell
Affiliation:
[email protected], NASA Ames Research Center, Moffett Field, CA, 94035, United States
Jun Li
Affiliation:
[email protected], NASA Ames Research Center, Moffett Field, CA, 94035, United States
Cary Y. Yang
Affiliation:
[email protected], Santa Clara University, Center for Nanostructures, 500 El Camino Real, Santa Clara, CA, 95053, United States
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Abstract

Scanning electron microscopy (SEM) for imaging the interface between carbon nanofibers (CNFs) and the underlying substrate is presented. By irradiating the electron beam perpendicular to the substrate, bright contrast is observed at the region where a small gap exists between the CNF and substrate. The energy-diameter diagram for the observation of the bright contrast is derived, which can be understood by using the theory of electron penetration into solid. Monte Carlo simulation is performed to reproduce the experimental observation based on our model, and the contrast sensitivity to the gap height is discussed.

Keywords

Cscanning electron microscopy (SEM)nanostructure
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 963: Symposium Q – Nanowires and Carbon Nanotubes – Science and Applications , 2006 , 0963-Q05-13
Copyright
Copyright © Materials Research Society 2007

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References

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