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The Behavior of Silicon and Boron in the Surface of Corroded Nuclear Waste Glasses: An Eftem Study

Published online by Cambridge University Press:  10 February 2011

E. C. Buck
Affiliation:
Argonne National Laboratory
K. L. Smith
Affiliation:
Australian Nuclear Science and Technology Organization
M. G. Blackford
Affiliation:
Australian Nuclear Science and Technology Organization
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Abstract

Using electron energy-loss filtered transmission electron microscopy (EFTEM), we have observed the formation of silicon-rich zones on the corroded surface of a West Valley (WV6) glass. This layer is approximately 100-200 nm thick and is directly underneath a precipitated smectite clay layer. Under conventional (C)TEM illumination, this layer is invisible; indeed, more commonly used analytical techniques, such as x-ray energy dispersive spectroscopy (EDS), have failed to describe fully the localized changes in the boron and silicon contents across this region. Similar silicon-rich and boron-depleted zones were not found on corroded Savannah River Laboratory (SRL) borosilicate glasses, including SRL-EA and SRL-51, although they possessed similar-looking clay layers. This study demonstrates a new tool for examining the corroded surfaces of materials.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

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References

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