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Band-Edge Photoresponse Characteristics of Diamond Msm's

Published online by Cambridge University Press:  21 February 2011

Mike Marchywka ,
Steven C. Binari ,
Deborah A. Koolbeck  and
Daniel Moses
Mike Marchywka
Affiliation:
E.O. Hulburt Center for Space Research Naval Research Laboratory, 4555 Overlook Avenue SW, Washington, DC 20375-5000 Internet: [email protected]
Steven C. Binari
Affiliation:
Electronic Science and Technology Division Naval Research Laboratory, 4555 Overlook Avenue SW, Washington, DC 20375-5000 Internet: [email protected]
Deborah A. Koolbeck
Affiliation:
E.O. Hulburt Center for Space Research Naval Research Laboratory, 4555 Overlook Avenue SW, Washington, DC 20375-5000 Internet: [email protected]
Daniel Moses
Affiliation:
E.O. Hulburt Center for Space Research Naval Research Laboratory, 4555 Overlook Avenue SW, Washington, DC 20375-5000 Internet: [email protected]
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Abstract

Band-edge photoresponse measurements on simple diamond metal-semiconductor-metal (MSM) devices can give information about the quality of the diamond material and its utility as a detector. We have fabricated several such devices on a variety of substrates and measured their response between 700 and 120nm with special emphasis around the band edge near 220nm. Steady state and transient response have been measured as a function of bias conditions. Transient response in this case refers to initial overshoot, undershoot, and increased dark current in response to a chopped vacuum ultraviolet (VUV) light signal for times on the order of seconds. We compare steady state quantum efficiency results to a simple model, discuss the characteristics of response versus applied voltage, and examine relationships between response and substrate properties.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 302: Symposium F – Semiconductors for Room-Temperature Radiation Detector Applications , 1993 , 311
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1. Denham, P., Lightowlers, E. C., and Dean, P. J., Physical Review 161, 762 (1968).Google Scholar
2. Pan, L. S., Kania, D. R., Pianetta, P., and Landen, O. L., Applied physics letters 57, 623 (1990).Google Scholar
3. Marchywka, M. et al. , Appld. Optics 30, 5011 (1991).Google Scholar
4. Kania, D. R. et al. , Journal of Applied Physics 68, 124 (1990).Google Scholar
5. Marchywka, M., Binari, S. C., and Moses, D., Diamond MIS capacitors for integrating radiation detection, in Proceedings of the 2nd Interntaiortal Conference on the Applications of Diamond Films and Related Materials, Saitama, Japan, 1993.Google Scholar
6. Eachmann, P. T., Collins, A. T., and Seal, M., editors, Proceedings of the Third International Conference New Diamond Science and Technology, Heidelberg, Germany, 1992, Materials Research Society.Google Scholar
7. Gildenbladt, G. S., Grot, S. A., Hatfield, C. W., and Badzian, A. R., IEEE EDL 12, 37 (1991).Google Scholar
8. Kiyota, H. et al. , Japanese Journal of Applied Physics 30, L2015 (1991).CrossRefGoogle Scholar
9. Kanicki, J., editor, Amorphous and Microcrystalline Semiconductor Devices: Optoelectronic Devices, Artech House, Boston, 1991.Google Scholar
10. Binari, S. C., Marchywka, M., Koolbeck, D. A., Dietrich, H. B., and Moses, D., Jrnl. of Diamond and Related Materials, to be published (1992).Google Scholar
11. Pankove, J. I., Optical Processes in Semiconductors, Dover Publications, New York, 1975.Google Scholar
12. Bube, R. H., Photoconductivity of Solids, John Wiley and Sons, New York, 1960.Google Scholar
13. Henisch, H. H., Semiconductor Contacts, Oxford Science Publications, New York, 1984.Google Scholar
14. Soole, J. B. and Schumacher, H., IEEE Jrnl. Quant. Elect. 27, 737 (1991).CrossRefGoogle Scholar
15. Palik, E., Handbook of Optical Constants of Solids, Academic Press, New York, 1985.Google Scholar
16. Pan, L. S. et al. , Science 255, 830 (1992).CrossRefGoogle Scholar
17. Trew, R. T., Yan, J. B., and Mock, P. M., Proceedings of the IEEE 79, 598 (1991).Google Scholar