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Automated diffraction tomography combined with electron precession: a new tool for ab initio nanostructure analysis

Published online by Cambridge University Press:  31 January 2011

Ute Kolb ,
Tatiana Gorelik  and
Enrico Mugnaioli
Ute Kolb
Affiliation:
[email protected], Johannes Gutenberg-University, Instiut for Physical Chemistry, Mainz, Germany
Tatiana Gorelik
Affiliation:
[email protected], Johannes Gutenberg-University, Instiut for Physical Chemistry, Mainz, Germany
Enrico Mugnaioli
Affiliation:
[email protected], Johannes Gutenberg-University, Instiut for Physical Chemistry, Mainz, Germany
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Abstract

Three-dimensional electron diffraction data was collected with our recently developed module for automated diffraction tomography and used to solve inorganic as well as organic crystal structures ab initio. The diffraction data, which covers nearly the full relevant reciprocal space, was collected in the standard nano electron diffraction mode as well as in combination with the precession technique and was subsequently processed with a newly developed automated diffraction analysis and processing software package. Non-precessed data turned out to be sufficient for ab initio structure solution by direct methods for simple crystal structures only, while precessed data allowed structure solution and refinement in all of the studied cases.

Keywords

scanning transmission electron microscopy (STEM)nanostructurecrystallographic structure
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1184: Symposium GG – Electron Crystallography for Materials Research and Quantitive Characterization of Nanostructured Materials , 2009 , 1184-GG01-05
Copyright
Copyright © Materials Research Society 2009

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