Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-23T08:42:37.497Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomistic observation of electron irradiation-induced defects in CeO2

Published online by Cambridge University Press:  21 February 2013

Seiya Takaki ,
Tomokazu Yamamoto ,
Masanori Kutsuwada ,
Kazuhiro Yasuda  and
Syo Matsumura
Seiya Takaki
Affiliation:
Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Fukuoka 819-0395, Japan
Tomokazu Yamamoto
Affiliation:
Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Fukuoka 819-0395, Japan
Masanori Kutsuwada
Affiliation:
Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Fukuoka 819-0395, Japan
Kazuhiro Yasuda
Affiliation:
Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Fukuoka 819-0395, Japan
Syo Matsumura
Affiliation:
Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Fukuoka 819-0395, Japan
Get access

Abstract

We have investigated the atomistic structure of radiation-induced defects in CeO2 formed under 200 keV electron irradiation. Dislocation loops on {111} habit planes are observed, and they grow accompanying strong strain-field. Atomic resolution scanning transmission electron microscopy (STEM) observations with high angle annular dark-field (HAADF) and annular bright-field (ABF) imaging techniques showed that no additional Ce layers are inserted at the position of the dislocation loop, and that strong distortion and expansion is induced around the dislocation loops. These results are discussed that dislocation loops formed under electron irradiation are non-stoichiometric defects consist of oxygen interstitials.

Keywords

Cedefectselectron irradiation
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1514: Symposium HH – Advances in Materials for Nuclear Energy , 2013 , pp. 93 - 98
Copyright
Copyright © Materials Research Society 2013 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Yasuda, K., Nastasi, M., Sickafus, K.E., Maggiore, C.J., Yu, N., Nucl. Instr. and Meth. B136 (1998) 499.10.1016/S0168-583X(97)00898-7CrossRefGoogle Scholar
Sasajima, N., Matsui, T., Hojou, K., Furuno, S., Otsu, H., Izui, K., Murumura, K., Nucl. Instr. and Meth. B141 (1998) 487.10.1016/S0168-583X(98)00194-3CrossRefGoogle Scholar
Pouchon, M.A., Nakamura, M., Hellwig, Ch., Ingold, F., Degueldre, C., J. Nucl. Mater. 319 (2003) 37.10.1016/S0022-3115(03)00131-4CrossRefGoogle Scholar
Sattonnay, G., Grygiel, C., Monnet, I., Legros, C., Herbst-Ghysel, M., Thome, L., Acta Materia 60 (2012) 22.10.1016/j.actamat.2011.09.017CrossRefGoogle Scholar
Xiao, H.Y., Zhang, Y., Weber, W.J., Phys. Rev. B86 (2012) 054109.10.1103/PhysRevB.86.054109CrossRefGoogle Scholar
McKinley, W.A., Feshbach, H., Phys. Rev. 74 (1948) 1759.10.1103/PhysRev.74.1759CrossRefGoogle Scholar
Yasunaga, K., Yasuda, K., Matsumura, S., Sonoda, T., Nucl. Instr. and Meth. B250 (2006) 114.10.1016/j.nimb.2006.04.091CrossRefGoogle Scholar
Yasunaga, K., Yasuda, K., Matsumura, S., Sonoda, T., Nucl. Instr. and Meth. B266 (2008) 2877.10.1016/j.nimb.2008.03.204CrossRefGoogle Scholar
Shiiyama, K., Yamamoto, T., Takahashi, T., Guglielmetti, A., Chartier, A., Yasuda, K., Matsumura, S., Yasunaga, K., Meis, C., Nucl. Instr. and Meth. B268 (2010) 2980.10.1016/j.nimb.2010.05.022CrossRefGoogle Scholar
Hojo, H Mizoguchi, T. Ohta, H. Findlay, S.D. Shibata, N. Yamamoto, T. Ikuhara, Y., Nano Let. 10 (2010) 4668.10.1021/nl1029336CrossRefGoogle Scholar
Findlay, S.D., Shibata, N., Sawada, H., Okunishi, E., Kondo, Y., Ikuhara, Y., Ultramicroscopy 110 (2010) 903.10.1016/j.ultramic.2010.04.004CrossRefGoogle Scholar
Guglielmetti, A., Chartier, A., Brutzel, L.V., Crocombette, J.-P., Yasuda, K., Meis, C., Matsumura, S., Nucl. Instr. and. Meth. B 266 (2008) 5120.10.1016/j.nimb.2008.09.010CrossRefGoogle Scholar