Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-25T15:25:19.555Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic Structure OF YΣ=5 (130) Symmetrical Tilt Boundary In Strontium Titanate

Published online by Cambridge University Press:  15 February 2011

V. Ravikumar  and
Vinayak P. Dravid
V. Ravikumar
Affiliation:
Department of Materials Science and Engineering and, Materials Research Center, Northwestern University, Evanston, IL 60208.
Vinayak P. Dravid
Affiliation:
Department of Materials Science and Engineering and, Materials Research Center, Northwestern University, Evanston, IL 60208.
Get access

Abstract

The atomic structure of a pristine (undoped) boundary in strontium titanate has been investigated using transmission electron microscopy techniques. Results of electron diffraction studies indicate a pure tilt boundary with a common \001] tilt axis, and a tilt angle of 36.8°, which corresponds to a Σ-= 5 grain boundary in the Coincidence Site Lattice (CSL) notation. High Resolution Transmission Electron Microscopy (HRTEM) indicates a symmetric tilt grain boundary with a (130) type grain boundary plane. No cation non-stoichiometry or impurity segregants could be detected at the interface, within the limits of the Energy Dispersive X-ray microanalysis technique used. The grain boundary has a compact core, with negligible planenormal rigid body translation (RBT). An in-plane RBT of (1/2)d130 (˜ 0.62 A°) was identified from the high resolution electron micrographs. An empirical model of the relaxed atomic structure of the grain boundary is proposed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 295: Symposium W – Atomic-Scale Imaging of Surfaces and Interfaces , 1992 , 115
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. See, for example, Interface Science and Engineering '87: An International Conference on the Structure and Properties of Internal Interfaces, J. de Physique 49 (1988)Google Scholar
2. Carter, C. B., in Surfaces and Interfaces of Ceramic Materials, edited by Dufour, Louis-C., Monty, Claude and Petot-Ervas, Georgette (Kluwer Academic Publishers, Boston, 1988), p. 29 Google Scholar
3. Merkle, K. L. and Smith, D. J., Phys. Rev. Lett. 59 [25], 2887 (1987); Ultramicroscopy 22, 57 (1987)Google Scholar
4. Sun, C. P. and Balluffi, R. W., Phil. Mag. A 46, 49 (1982)Google Scholar
5. Morrissey, K. J. and Carter, C. B., J. Am. Ceram. Soc. 67 [4[, 292 (1984)Google Scholar
6. Duffy, D. M. and Tasker, P. W., Phil. Mag. A 48 [1], 155 (1983); J. de Physique 46, 185 (1985)Google Scholar
7. Dravid, Vinayak P. et. al., Met. Trans. A 21A, 2309 (1990)Google Scholar
8. Yamaoka, N. and Matsui, T. in Grain Bounday Phenomena in Electroceramics edited by Levinson, L. M. and Hill, D. C. (Advances in Ceramics Vol 1, AcerS Publishers, Columbus, OH, 1986) p. 232 Google Scholar
9. Park, H. D. and Payne, D. A. in Grain Bounday Phenomena in Electroceramics, edited by Levinson, L. M. and Hill, D. C. (Advances in Ceramics Vol 1, AcerS Publishers, Columbus, OH, 1986) p. 242 Google Scholar
10. Fujimoto, M. and Kingery, W. D., J. Am. Ceram. Soc 68 [4], 169 (1985)Google Scholar
11. Yamaoka, N. et. al., Am. Ceram. Soc. Bull 62 [6], 698 (1983)Google Scholar
12. NUMIS©, High Resolution Image Simulation Program, Northwestern UniversityGoogle Scholar