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Atomic Scale Properties of Normal and Inverted MBE-Grown Interfaces as Revealed by Zeeman Studies

Published online by Cambridge University Press:  22 February 2011

W. Grieshaber ,
C. Bodin ,
J. Cibert ,
A. Wasiela ,
Y. Merle-D'Aubigne ,
J. Gaj  and
G. Feuillet
W. Grieshaber
Affiliation:
Laboratoire de Spectrométrie Physique, B.P. 87, 38402 St. Martin d'Hères Cedex, France
C. Bodin
Affiliation:
Laboratoire de Spectrométrie Physique, B.P. 87, 38402 St. Martin d'Hères Cedex, France
J. Cibert
Affiliation:
Laboratoire de Spectrométrie Physique, B.P. 87, 38402 St. Martin d'Hères Cedex, France
A. Wasiela
Affiliation:
Laboratoire de Spectrométrie Physique, B.P. 87, 38402 St. Martin d'Hères Cedex, France
Y. Merle-D'Aubigne
Affiliation:
Laboratoire de Spectrométrie Physique, B.P. 87, 38402 St. Martin d'Hères Cedex, France
J. Gaj
Affiliation:
Institute of Experimental Physics Warshaw University, 69 Hoza, 00-681 Warszawa, Poland
G. Feuillet
Affiliation:
DRFMC-SP2M-PSC, CEN Grenoble, 17 av. des Martyrs, 38054 Grenoble Cedex, France
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Abstract

The enhanced Zeeman effect of excitons in asymmetric CdZnTe-CdTe-CdMnTe quantum wells is studied quantitatively to gain information separately on the profile of the normal and inverted interfaces. The normal interface appears as more “abrupt” than the inverted interface. This behaviour is well accounted for if we assume that during the growth a rapid Cd/Mn exchange takes place between the surface layer and the subsurface one.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 340: Symposium E – Compound Semiconductor Epitaxy , 1994 , 587
Copyright
Copyright © Materials Research Society 1994

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References

REFERENCES

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