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Atomic Resolution Studies of Tilt Grain Boundaries in NiO

Published online by Cambridge University Press:  28 February 2011

K. L. Merkle ,
J. F. Reddy ,
C. L. Wiley ,
David J. Smith  and
G. J. Wood
K. L. Merkle
Affiliation:
Materials Science and Technology Division, Argonne National Laboratory, Argonne, IL 60439
J. F. Reddy
Affiliation:
Materials Science and Technology Division, Argonne National Laboratory, Argonne, IL 60439
C. L. Wiley
Affiliation:
Materials Science and Technology Division, Argonne National Laboratory, Argonne, IL 60439
David J. Smith
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, AZ 85281
G. J. Wood
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, AZ 85281
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Abstract

The atomic structures of a number of <001> high-angle tilt grain boundaries in NiO have been studied by high-resolution electron microscopy (HREM). Crystal 1inity is always maintained right up to the grain boundary (GB). Grain boundary planes bounded by a (100)-plane are preferred, however symmetrical facets are also found at each misorientation. A tendency to match atomic planes across the GB is not only observed in symmetrical, but also in asymmetrical GBs. Structural units can be clearly recognized in symmetrical GBs. Contrast differences suggest that a multiplicity of structural units exists for some GB configurations. Frequently symmetric GBs also show deviations from mirror symmetry. Multislice simultations indicate that the image contrast associated with HREM GB images is not particularly sensitive to GB relaxation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 60: Symposium L – Defect Properties and Processing of High-Technology Nonmetallic Materials , 1985 , 227
Copyright
Copyright © Materials Research Society 1986

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References

1. Clarke, D. R., Ultramicroscopy 4, 33 (1979).Google Scholar
2. Rühle, M., J. de Phys. 46, C4-281 (1985).Google Scholar
3. Rühle, M. and Sass, S. L., Phil. Mag. A49, 759 (1984).Google Scholar
4. Merkle, K. L., Reddy, J. F., and Wiley, C. L., J. de Phys. 46, C4-95 (1985).Google Scholar
5. Duffy, D. M. and Tasker, P. W., Phil. Mag. A47, 817 (1983).Google Scholar
6. Wolf, D., Phil. Mag. A49, 823 (1984),CrossRefGoogle Scholar
Mater. Res. Soc. Symp. Proc. 24, 47 (1984).Google Scholar
7. Eastman, J., Schmükle, F., Vaudin, M. D., and Sass, S. L., Adv. Ceram. 10, 324 (1984).Google Scholar
8. Brokman, A., Bristowe, P. D., and Balluffi, R. W., Scripta Metall. 15, 201 (1981).Google Scholar
9. Wolf, D., Physica 131B, 53 (1985).Google Scholar
10. Wolf, D., J. de Phys. 46, C4-197 (1985).Google Scholar
11. Merkle, K. L., Reddy, J. F., and Wiley, C. L., Mater. Res. Soc. Symp. Proc. 41, 213 (1985).Google Scholar
12. Wood, G. J., Merkle, K. L., and Smith, D. J., in preparation.Google Scholar