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Atomic Force Microscopy of Growth Features on Epitaxial CdHgTe Films

Published online by Cambridge University Press:  25 February 2011

M. Aindow ,
T. T. Cheng ,
I. P. Jones ,
M. G. Astles  and
D. J. Williams
M. Aindow
Affiliation:
School of Metallurgy and Materials, The University of Birmingham, Edgbaston, B15 2TT, UK.
T. T. Cheng
Affiliation:
School of Metallurgy and Materials, The University of Birmingham, Edgbaston, B15 2TT, UK.
I. P. Jones
Affiliation:
School of Metallurgy and Materials, The University of Birmingham, Edgbaston, B15 2TT, UK.
M. G. Astles
Affiliation:
Defence Research Agency, Electronics Division, Malvern, WR14 3PS, UK.
D. J. Williams
Affiliation:
School of Metallurgy and Materials, The University of Birmingham, Edgbaston, B15 2TT, UK.
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Abstract

Atomic Force Microscopy has been used to observe the details of surface morphology on CdxHg1-xTe epitaxial films. On films grown by liquid phase epitaxy (LPE), tiered pyramidal features were observed and these are consistent with enhanced nucleation and growth at emergent edge dislocations which thread through from subgrain boundaries in the substrate. On films grown by metal-organic vapour phase epitaxy (MOVPE) using the interdiffused multilayer process (IMP), terraces and steps are observed as expected but the step edges are decorated. It is suggested that this corresponds to the deposition of one binary layer in Volmer-Weber mode.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 280: Symposium B – Evolution of Surface and Thin Film Microstructure , 1992 , 153
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

Bauser, E. and Strunk, H., J. Crystal Growth, 51, 367 (1981).Google Scholar
[2] Mutaftschiev, B., in Dislocations in Solids, edited by Nabarro, F.R.N., (North Holland, Amsterdam, 1980) p.57.Google Scholar
[3] Nouruzi-Khorasani, A., Jones, I.P., Dobson, P.S., Etem, Y., Williams, D.J., Astles, M.G., Ard, C. and Coates, G., J. Crystal Growth, 102, 819 (1990).CrossRefGoogle Scholar