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Atomic and Electronic Structure of Boron-Doped Diamond Grain Boundaries Studied by Arhvtem and ab-Initio Calculation

Published online by Cambridge University Press:  01 February 2011

Hiroyuki Togawa  and
Hideki Ichinose
Hiroyuki Togawa
Affiliation:
Department of Materials science, The University of Tokyo: 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan
Hideki Ichinose
Affiliation:
Department of Materials science, The University of Tokyo: 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan
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Abstract

Atomic resolution high-voltage transmission electron microscopy and electron energy loss spectroscopy were performed on grain boundaries of boron-doped diamond, cooperated with the ab-initio calculation. Segregated boron in the {112}∑3 boundary was caught by the EELS spectra. The change in atomic structure of the segregated boundary was successfully observed from the image by ARHVTEM. Based on the ARHVTEM image, a segregted structure model was proposed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 764: Symposium C – New Applications for Wide-Bandgap Semiconductors , 2003 , C3.9
Copyright
Copyright © Materials Research Society 2003

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References

1. Nemanich, R. J., Annu. Rev. Matter. Sci. 21, 535–558(1991)Google Scholar
2. Ichinose, H. and Nakanose, M., Thin Solid Films. 319, 87 (1998)Google Scholar
3. Zhang, Y., Ichinose, H.. Nakanose, M., Ito, K., Ishida, Y., J. Electron Microscopy, 45, 436 (1996)Google Scholar
4. Zhang, Y., Ichinose, H., Nakanose, M., Ito, K., Ishida, Y., J. Electron Microscopy, 48, 245 (1999)Google Scholar
5. Kohyama, M., Ichinose, H., Ishida, Y. and Nakanose, M., Materials Science Forum Vols. 207, 261 (1996)Google Scholar
6. Sawada, H. and Ichinose, H., Scripta mater. 44, 2327 (2001)Google Scholar
7. Ichinose, H., Sawada, H., Takuma, E. and Osaki, M., J. Electron Microscopy, 48, 887 (1999)Google Scholar
8. Kohyama, M., Phil. Mag. Lett. 79, 659 (1999)Google Scholar