Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-25T17:55:02.387Z Has data issue: false hasContentIssue false
  • English
  • Français

Atom Probe and Hrem Characterization of Transition Metal Multilayers.

Published online by Cambridge University Press:  21 February 2011

A. Cerezo ,
M.G. Hetherington  and
A.J.K. Petford-Long
A. Cerezo
Affiliation:
Department of Metallurgy and Science of Materials, University of Oxford, Oxford, OX1 3PH, England.
M.G. Hetherington
Affiliation:
Department of Metallurgy and Science of Materials, University of Oxford, Oxford, OX1 3PH, England.
A.J.K. Petford-Long
Affiliation:
Department of Metallurgy and Science of Materials, University of Oxford, Oxford, OX1 3PH, England.
Get access

Abstract

The direct measurement of the composition variations in transition metal multilayers has been carried out using the atom-probe and the position sensitive atom-probe (POSAP). The atom-probe and POSAP do not have sufficient resolution to determine the crystal structure and this complementary information has been obtained using high resolution electron microscopy.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 187: Symposium J – Thin Film Structures and Phase Stability , 1990 , 333
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Cerezo, A., Godfrey, T. J., Grovenor, C. R. M., Hetherington, M. G., Hoyle, R. M., Jakubovics, J. P., Liddle, J. A., Smith, G. D. W., and Worrall, G. M., J.Microscopy, 154, 215 (1989).Google Scholar
2. Cerezo, A. and Hetherington, M. G., J. de Phys., 50–C8 523, (1989).Google Scholar
3. Liddle, A., Cerezo, A., Grovenor, C. R. M., J. de Phys. 50–C8, 437 (1989).Google Scholar