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Application of Scanning Tunneling Microscopy to the Study of Metals: Spectroscopy and Topography

Published online by Cambridge University Press:  26 February 2011

R. C. Jaklevic  and
W. J. Kaiser
R. C. Jaklevic
Affiliation:
Research Staff, Ford Motor Co., Dearborn, MI 48121, USA
W. J. Kaiser
Affiliation:
Research Staff, Ford Motor Co., Dearborn, MI 48121, USA
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Abstract

The design and performance of a scanning tunneling microscope for use in the study of metal surfaces is described. The system was designed for ultra high vacuum together with standard sample cleaning and characterization techniques. The STM provides both topographic and spectroscopie information. Topographic images of well annealed Au(lll) show very smooth planes with single atomic steps. Corrugation on the (111) planes, which is expected from reconstruction models for this surface, is not seen. Other areas show monatomic steps in the form of an ordered array with a period corresponding to that derived from previous studies. A possible alternative reconstruction mechanism is suggested by these STM data. On the same surface are steeper sloped regions with multiple steps of equal height with wide facets. Spectroscopie first derivative data for Au and Pd show peaks which correspond to surface and bulk electronic states, for both filled and unfilled cases. The energy values of these states are compared directly with the results of other experimental methods. The use of combined topographic and spectroscopie mode for metals is anticipated.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 77: Symposium D – Interfaces, Superlattices, and Thin Films , 1986 , 13
Copyright
Copyright © Materials Research Society 1987

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References

REFERENCES

1. Birmig, G. and Rohrer, H., Helvetica Physica Acta 55, 726 (1982); Surface Science 126, 236 (1983);IBM J. Res. and Dev. 30, 355 (1986).Google Scholar
2. Baratoff, A., Binnig, G., Fuchs, H., Salvan, F. and Stoli, E., Surface Science 168, 734 (1986).Google Scholar
3. Becker, R. S., Golovchenko, J. A., Hamann, D. R. and Swartzentruber, B. S., Phys. Rev. Lett. 55, 2032 (1985).Google Scholar
4. Feenstra, R. M., Thompson, W. A., and Fein, A. P., Phys. Rev. Lett. 56, 608 (1986).Google Scholar
5. Hamers, R. J., Tromp, R. M. and Demuth, J. E., Phys. Rev. Lett. 56, 1972 (1986).Google Scholar
6. Kaiser, W. J. and Jaklevic, R. C., IBM J. of Res. and Dev. 210, 411 (1986).Google Scholar
7. Kaiser, W. J. and Jaklevic, R. C., Proceedings of the First Int. Conference on Scanning Tunneling Microscopy (STM'86), Surface Science (to be published).Google Scholar
8. Binnig, G., Rohrer, H., Ch., Gerber and Stoll, E., Surface Science 144, 321 (1984).Google Scholar
9. Behm, R. J., Hosier, W., Ritter, E. and Binnig, G., Phys. Rev. Lett. 56, 228 (1986).Google Scholar
10. Zehner, D. M. and Wendelken, J. F., Proceedings of the Seventh Int. Vacuum Congress and the Third Int. Conference of Solid Surfaces, Vienna, 1977, edited by Dobrozemsky, R. et al. (F. Berger and Sohne, Vienna, 1977), p. 517.Google Scholar
11. Harten, U., Lahee, A. M., Peter Toennies, J. and Ch., Woll, Phys. Rev. Lett. 54, 2619 (1985) and refs. therein.CrossRefGoogle Scholar
12. Jaklevic, R. C. and Lambe, J., Surf. Sci. 37, 922 (1973); Phys. Rev. B12, 4146 (1975).Google Scholar
13. Hussain, Z. and Smith, N. V., Physics Lett. 66A, 492 (1978).Google Scholar
14. Christensen, N. E. and Seraphin, B. O., Phys. Rev B4, 3321 (1971).Google Scholar
15. Christensen, N. E., Phys. Rev. B14, 3446 (1976);Google Scholar
Himpsel, F. J. and Eastman, D. E., Phys. Rev. B18, 5236 (1978).CrossRefGoogle Scholar
16. Demuth, J. E., Surface Science. 65, 369 (1977).Google Scholar