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Application of Nucleation and Growth Theory to the Development of Industrial Products

Published online by Cambridge University Press:  26 February 2011

John E. May*
Affiliation:
General Electric Co., Power Electronics Semiconductor Dept. Electronics Park 7, Syracuse, NY 13221
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Abstract

In this paper we discuss some features of the microstructure of large-grainsized very low voltage varistors and the effects of heat treatments on the pre-breakover electrical characteristics. It is shown that a second phase precipitates in the bismuth-rich segregation phase and is thought responsible for the reduced device leakage properties.

Type
Research Article
Copyright
Copyright © Materials Research Society 1987

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