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The Application of Neutron Topography to the Study of X-ray Sensitive Organic Crystals - a Possible Alternative to X-ray Topography.

Published online by Cambridge University Press:  21 February 2011

M. Dudley
M. Dudley*
Affiliation:
Department of Materials Science and Engineering, State University of New York at Stony Brook, Stony Brook, New York 11794, U.S.A.
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Abstract

Neutron topography has been carried out on organic single crystals of varying Xray sensitivity, in order to test the feasibility of the technique as an alternative to X-ray topography for the study of the influence of defects on the solid state reactivity of X-ray sensitive single crystals. Specimens studied include the diacetylene PTS, and Pyrene. A comparison of the strain sensitivity and spatial resolution of the neutron and X-ray based techniques is made. Preliminary results of dynamic neutron topographic studies of the UV induced polymerization in PTS are presented. These results are compared to those obtained from similar X-ray topographic studies.

Results indicate that the neutron technique can be a useful ally technique to the analogous X-ray techniques in studies of the influence of defects on reactivity in specimens of moderate X-ray sensitivity. In cases of extreme sensitivity, the neutron technique is the only one available for studies of this nature.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 166: Symposium J – Neutron Scattering for Materials Science , 1989 , 55
Copyright
Copyright © Materials Research Society 1990

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References

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