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Application of High Spatial Resolution Electron Diffraction Techniques to the Study of Local Properties of Crystalline Solids

Published online by Cambridge University Press:  21 February 2011

J W Steeds ,
X F Duan ,
P A Midgley ,
P Spellward  and
R Vincent
J W Steeds
Affiliation:
Physics Department, University of Bristol, Bristol BS8 1TL, UK
X F Duan
Affiliation:
Physics Department, University of Bristol, Bristol BS8 1TL, UK
P A Midgley
Affiliation:
Physics Department, University of Bristol, Bristol BS8 1TL, UK
P Spellward
Affiliation:
Physics Department, University of Bristol, Bristol BS8 1TL, UK
R Vincent
Affiliation:
Physics Department, University of Bristol, Bristol BS8 1TL, UK
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Abstract

The addition of a Gatan imaging parallel electron-energy loss spectrometer (IPEELS) to a Hitachi HF 2000 cold field emission TEM has allowed us to produce high quality energy-filtered coherent electron diffraction patterns and electron holograms from a wide variety of materials. In this paper we review the recent achievements and make an assessment of the use of coherent electron diffraction in solving problems at high spatial resolution in materials science.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 332: Symposium U – Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy , 1994 , 129
Copyright
Copyright © Materials Research Society 1994

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References

REFERENCES

[1] Steeds, J.W., Vincent, R., Vine, W. J., Spellward, P. & Cherns, D., Acta Microscopica 1 (1992)1 (also abridged in Hitachi News 24 (1992)).Google Scholar
[2] Vincent, R., Midgley, P. A. & Spellward, P., Proceedings of EMAG 93, Institute of Physics: in the press.Google Scholar
[3] Steeds, J.W., Vincent, R., Spellward, P. & Duan, X. F., Proc 5 1st Annual Meeting of MSA 1054 (1993).Google Scholar
[4] Vincent, R., Vine, W.J., Midgley, P.A., Spellward, P. & Steeds, J.W., Ultramicroscopy, 50 365 (1993).CrossRefGoogle Scholar
[5] Duan, X.F., Grigorieff, N., Cherns, D., Steeds, J.W. & Sheng, C.. Proc. 8 th Conf. on Microscopy of Semiconducting Materials Inst. of Phys. 1993, in the press.Google Scholar
[6] Spence, J.C.H.. Scanning Electron Microscopy Vol 1, SEM Inc., AMF O'Hare 1978, p61.Google Scholar
[7] Vincent, R. & Midgley, P.A.. Ultramicroscopy, in the press.Google Scholar
[8] Wang, J.N., Steeds, J.W. & Hopkinson, M.. Semicond. Sci. Tech. 8 502 (1993).Google Scholar
[9] Tonomura, A., Matsuda, T., Kawasaki, T., Endo, J. & Osakabe, N.. Phys. Rev.Lett. 54 60 (1985).CrossRefGoogle Scholar
[10] Bonevich, J.E., Harada, K., Matsuda, T., Kasai, H., Yoshida, T., Pozzi, G. & Tonomura, A.. Proceedings of 51st Annual Meeting of MSA 1096 (1993).Google Scholar
[11] Grigorieff, N., Cherns, D., Yates, M.J., Hockly, M., Perrin, S.D. & Aylett, M.R.. Phil. Mag. A68, (1993) 121.Google Scholar