Hostname: page-component-7bb8b95d7b-495rp Total loading time: 0 Render date: 2024-09-21T03:28:00.722Z Has data issue: false hasContentIssue false
  • English
  • Français

The Application of Glancing Angle Exafs to Study the Structure of Platinum-Nickel Multilayers

Published online by Cambridge University Press:  25 February 2011

G.M. Lamble ,
S.M. Heald  and
B.M. Clemens
G.M. Lamble
Affiliation:
North Carolina State University, Box 8202, NC 27695-8202
S.M. Heald
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973
B.M. Clemens
Affiliation:
Dept. of Material Science and Engineering, Stanford University, Stanford, CA 94305-2205
Get access

Abstract

Recent reports have correlated the mechanical properties of multilayers with a structural expansion of the constituents. Whether this expansion is an interface or bulk effect remains in dispute. We apply the technique of glancing angle EXAFS to obtain information about the local structure and multilayer composition and use these results to shed light on certain aspects of this controversy. The experiments were performed on platinum-nickel multilayers of varying bilayer thickness. Measurements were made by fluorescence detection of EXAFS beyond both the Pt LIII and the Ni K edges. Considerable interlayer mixing is evident, as is the presence of order within the interface. We additionally find that the bulk metallic character is retained within the layers.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 159: Symposium C – Atomic Scale Structure of Interfaces , 1989 , 389
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Yang, W. M. C., Tsakalakos, T. and Hilliard, J. E., J. Appl. Phys. 48, 876 (1977).Google Scholar
2 Schuller, I. K., Ultrasonics symposium, ed: McAvoy, B. R., IEEE Symposium on Ultrasonics, 1985 (IEEE, New York, 1985) 1093.Google Scholar
3 Jankowski, A. F. and Tsakalakos, T., J. Phys. F 15, 1279 (1985).Google Scholar
4 Cammarata, R. C. and Sieradzki, K., Phys. Rev. Lett. 62, 2005, (1989).Google Scholar
5 Wu, T. B., J. Appl. Phys. 53, 5265 (1982).Google Scholar
6 Schuller, I. K. and Rahman, A., Phys. Rev. Lett. 50, 1377 (1983).Google Scholar
7 Schuller, I. K. and Grimsditch, M., J. Vac. Sci. Technol. B 4, 1444 (1986).Google Scholar
8 Huberman, M. L. and Grimsditch, M., Phys. Rev. Lett. 62, 1403 (1989).Google Scholar
9 Bennet, W. R., Leavitt, J. A. and Falco, C. M., Phys. Rev. B 35, 4199 (1987).Google Scholar
10 Wolf, D. and Lutsko, J. F., Phys. Rev. Lett. 60, 1170 (1988).Google Scholar
11 Clemens, Bruce M. and Eesley, Gary L., Phys. Rev. Lett. 61, 2356 (1988).Google Scholar
12 Gurman, S.J., Binsted, N. and Ross, I., J. Phys. C 17, 143 (1984).Google Scholar
13 Lee, P. A. and Pendry, J. B., Phys. Rev. B 11, 2795 (1975).Google Scholar
14 Heald, S. M. and Tranquada, J. M., J. Appl. Physics 65, 290 (1989)Google Scholar