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Application of a Desk-Side Double-Axis X-Ray Diffractometer for Very Large Area Epilayer Characterization
Published online by Cambridge University Press: 22 February 2011
Abstract
A new desk-side double-axis X-ray diffractometer capable of rapid, automatic measurement of lattice mismatch between epitaxial thin films and substrate in a two dimensional grid 150 mm square has been built. The design principles behind the five independent axis systems, specimen loading, and the fail-to-safety X-ray shutter are elucidated, and examples of typical data from substrate material and thin epitaxial films of III-V compounds are presented.
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- Copyright © Materials Research Society 1991
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