Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-25T21:31:42.652Z Has data issue: false hasContentIssue false

Annealing Behavior of Ba2Ycu3+XO7+Y Thin Films

Published online by Cambridge University Press:  28 February 2011

T. Siegrist
Affiliation:
AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, NJ 07974.
E. Coleman
Affiliation:
AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, NJ 07974.
Get access

Abstract

The annealing behavior of Ba2YCu3+xO7+y films grown by coevaporation of BaF2, Y and Cu on SrTiO3 has been studied as a function of temperature. Upon annealing at temperatures below 800°C, the phase forming first is Ba2YCu4O8, independent of the starting stoichiometry. Higher temperatures, above approximately 825 ° C are needed for Ba2YCu3O7 to crystallize.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Mankiewich, P. M., Scofield, J. H., Skocpol, W. J., Howard, R. E., Dayem, A. H., and Good, E., Appl. Phys. Lett. 51, 1753 (1987).Google Scholar
2 Chan, S.‐W., Bagley, B. G., Greene, L. H., Giroud, M., Feldmann, W. L., Jenkins, K. J., and Wilkins, B. J., Appl. Phys. Lett. 53, 1443 (1988).Google Scholar
3 Coleman, E., Siegrist, T., and Yeh, J. J., J. Electr. Mater., in press.Google Scholar
4 Bovet, P., Chaillout, C., Chevanas, J., Hodeau, J. L., Marezio, M., Karpinski, J., and Kaldis, E., Nature 334, 596 (1988).Google Scholar
5 Tallon, J. L., Pooke, D. M., Buckley, R. G., Presland, M. R., and Blunt, F. J., Phys. Rev. B, preprint.Google Scholar