Hostname: page-component-745bb68f8f-5r2nc Total loading time: 0 Render date: 2025-01-14T02:44:03.408Z Has data issue: false hasContentIssue false
  • English
  • Français

The Analysis of Vapor-Deposited Pd Particles Supported on Thin Oxides

Published online by Cambridge University Press:  28 February 2011

Helmut Poppa ,
F. Rumpf ,
R. D. Moorhead  and
C. Henry
Helmut Poppa
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, California 95120–6099
F. Rumpf
Affiliation:
Department of Chemical Engineering, Stanford University, Stanford, California 94350
R. D. Moorhead
Affiliation:
NASA Ames Research Center, Moffett Field, California 94035
C. Henry
Affiliation:
Department of Chemical Engineering, Stanford University, Stanford, California 94350
Get access

Abstract

Problems of analyzing by TEM and TPD (Temperature Programmed Desorption) the structure and micromorphology of small Pd particles vapor deposited in UHV onto clean oxide supports are discussed. Particle changes induced during extended exposures to high intensity electron irradiation of a number of electron transparent support materials such as Al2O3, SiO2, TiO2, MgO, and mica are examined. Different damage mechanisms are evaluated and experimental means of reducing the damage are explored. The possibility of extracting particle morphology information from a detailed analysis of CO thermal desorption spectra is also investigated. Evidence suggests that it may be possible to obtain micromorphology information down to very small particle sizes from TPD measurements if the effects of intrinsic particle morphology can be separated from the influence of diffusion of support species.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 111: Symposium O – Microstructure and Properties of Catalysts , 1987 , 1
Copyright
Copyright © Materials Research Society 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Poppa, H., Vacuum 34,1081 (1984).CrossRefGoogle Scholar
2. Poppa, H., Ultramicroscopy 11, 105 (1983).CrossRefGoogle Scholar
3. Poppa, H., Moorhead, R.D., Heinemann, K., Thin Solid Films 128, 251 (1985).CrossRefGoogle Scholar
4. Hobbs, L.W., Ultramicroscopy 23, 339 (1987).CrossRefGoogle Scholar
5. Egerton, R.F., Ultramicroscopy 23, 305 (1987).CrossRefGoogle Scholar
6. Low-T TEM provided by DrMardingly, J., Lockheed Research Laboratories, Sunnyvale, California.Google Scholar
7. Heinemann, K., Poppa, H., J. Vac. Sci. Techn. A4, 127 (1986).CrossRefGoogle Scholar
8. Yacaman, M.J., Heinemann, K., Poppa, H., CRC Critical Rev. Sol. State Mat. 10, 243 (1983).CrossRefGoogle Scholar
9. Datye, A.K., MRS National Symposium, Boston, December 1987; L.D. Schmidt, MRS National Symposium, Boston, December 1987.Google Scholar
10. Hulse, J., Kuppers, J., Wandelt, K., Ertl, G., Surf. Sci. 6, 453 (1980).Google Scholar
11. Takasu, Y., Unwin, R., Tesche, B., Bradshaw, A.M., Grunze, M., Surf. Sci. 77, 219 (1978).CrossRefGoogle Scholar
12. Thomas, M., Dickinson, J.T., Poppa, H., Pound, G.M., J. Vac. Sci. Techn. 15, 568 (1978).CrossRefGoogle Scholar
13. Doering, D.L., Poppa, H., Dickinson, J.T., J. Vac. Sci. Techn. 17, 198 (1980).CrossRefGoogle Scholar
14. Koch, R., Browning, R., to be published.Google Scholar
15. Drechsler, M., Surface Mobilities on Solid Materials, edited by Binh, V. Thien, NATO Advanced Study Institute (Plenum Press, New York/London 1981), p. 405.Google Scholar
16. Heyraud, J.C., Metois, J.J., J. Cryst. Growth 50, 571 (1980).CrossRefGoogle Scholar
17. Wang, T., Lee, C., Schmidt, L.D., Surf. Sci. 163, 181 (1985).CrossRefGoogle Scholar
18. Park, C., Durrer, W.G., Poppa, H., Dickinson, J.T., J. Catalysis 95, 361 (1985).CrossRefGoogle Scholar
19. Doering, D.L., Poppa, H., Dickinson, J.T., J. Catalysis 73, 104 (1982).CrossRefGoogle Scholar
20. Durrer, W.G., Poppa, H., Dickinson, J.T., Park, C., J. Vac. Sci. Techn. A 3, 1545 (1985).CrossRefGoogle Scholar
21. Gillet, E., Channakhone, S., Matolin, V., J. Catal. 97, 437 (1986).CrossRefGoogle Scholar
22. Altman, E.I., Gorte, R.J., Surf. Sci. 172, 71 (1986).CrossRefGoogle Scholar
23. Koch, R., Poppa, H., JVST A (5), 1845 (1987).CrossRefGoogle Scholar
24. Kiskinova, M.P., Bliznakov, G.M., Surf. Sci. 123, 61 (1982).CrossRefGoogle Scholar
25. Koch, R., Poppa, H., Thin Solid Films 151, 365 (1987).CrossRefGoogle Scholar
26. Koch, R., to be published.Google Scholar
27. Van Hardeveld, R., Hartog, F., Surf. Sci. 15, 189 (1969).CrossRefGoogle Scholar
28. Henry, C.R., Poppa, H., Proc. AVS National Symposium, Anaheim/California, Novevember 1987, to be published.Google Scholar
29. Micrograph acquired at the National Facility for Electron Microscopy, Univeristy of California, Berkeley, California.Google Scholar