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Analysis of Interface Structures by Quantitative High-Resolution Transmission Electron Microscopy

Published online by Cambridge University Press:  10 February 2011

O. Kienzle ,
M. Exner  and
F. Ernst
O. Kienzle
Affiliation:
Max-Planck-Institut für Metallforschung, Seestraβe 92, 70174 Stuttgart, Germany
M. Exner
Affiliation:
Max-Planck-Institut für Metallforschung, Seestraβe 92, 70174 Stuttgart, Germany
F. Ernst
Affiliation:
Max-Planck-Institut für Metallforschung, Seestraβe 92, 70174 Stuttgart, Germany
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Abstract

Quantitative evaluation rather than visual inspection of HRTEM images provides objective, reproducible, and very accurate information on the atomistic structure of internal interfaces. This paper explains the method we have developed to analyze the structure of grain boundaries. To demonstrate the power of our approach we present an analysis of the Σ3 (111) grain boundary in SrTiO3. We have determined the coordinates of the atom columns at this interface with a precision of 0.015 nm. Thus, our experimental results provide a sensitive test for physical theories and model structures obtained by computer simulation. First results of computer modeling are presented in this paper. The calculated structure of minimum energy has the same characteristic features as the structure determined by experiment.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 466: Symposium G – Atomic Resolution Microscopy of Surfaces and Interfaces , 1996 , 95
Copyright
Copyright © Materials Research Society 1997

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References

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