Hostname: page-component-78c5997874-94fs2 Total loading time: 0 Render date: 2024-11-17T18:21:34.313Z Has data issue: false hasContentIssue false
  • English
  • Français

An atom probe tomography study of grain boundary segregation in nanocrystalline Ni-W

Published online by Cambridge University Press:  26 February 2011

Andrew Detor ,
Michael K. Miller  and
Christopher A. Schuh
Andrew Detor
Affiliation:
[email protected], Massachusetts Institute of Technology, 77 Massachusetts Ave., Room 8-006, Cambridge, MA, 02139, United States
Michael K. Miller
Affiliation:
[email protected]
Christopher A. Schuh
Affiliation:
[email protected]
Get access

Abstract

Atom probe tomography is used to observe the solute distribution in electrodeposited nanocrystalline Ni-W alloys with three different grain sizes (3, 10, and 20 nm) and the results are compared with atomistic computer simulations. The presence of grain boundary segregation is confirmed by detailed analysis of composition fluctuations in both experimental and simulated structures, and its extent quantified by a frequency distribution analysis. In contrast to other nanocrystalline alloys, the present Ni-W alloys exhibit only a subtle amount of solute segregation to the intergranular regions. This finding is consistent with quantitative predictions for these alloys based upon a thermodynamic model of grain boundary segregation.

Keywords

nanostructureelectrodepositiongrain boundaries
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 903: Symposium Z – Amorphous and Nanocrystalline Metals for Structural Applications , 2005 , 0903-Z03-01
Copyright
Copyright © Materials Research Society 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Weissmuller, J, Krauss, W, Haubold, T, Birringer, R, Gleiter, H, Nanostruc. Mater. 1, 439 (1992).Google Scholar
[2] Liu, F, Kirchheim, R, J. Cryst. Growth 264, 385 (2004).Google Scholar
[3] Weissmuller, J, Nanostruc. Mater. 3, 261 (1993).Google Scholar
[4] Kirchheim, R, Acta Mater. 50, 413 (2002).Google Scholar
[5] Beke, DL, Cserhati, C, Szabo, IA, J. Appl. Phys. 95, 4996 (2004).Google Scholar
[6] Krill, CE, Klein, R, Janes, S, Birringer, R, Mat. Sci. Forum 179–181, 443 (1995).Google Scholar
[7] Farber, B, Cadel, E, Menand, A, Schmitz, G, Kirchheim, R, Acta Mater. 48, 789 (2000).Google Scholar
[8] Miller, MK, Cerezo, A, Hetherington, MG, Smith, DA, Atom Probe Field Ion Microscopy, (Clarendon Press, Oxford, 1996).Google Scholar
[9] Miller, MK, Atom Probe Tomography: Analysis at the Atomic Level, (Kluwer Academic/Plenum Publishers, Boston, 2000).Google Scholar
[10] Younes, O, Gileadi, E, J. Electrochem. Soc. 149, 100 (2002).Google Scholar
[11] Yamasaki, T, Tomohira, R, Ogino, Y, Schlossmacher, P, Ehrlich, K, Plat. Surf. Fin. 87, 148 (2000).Google Scholar
[12] Cullity, BD, Elements of x-ray diffraction, ed 2. (Addison-Wesley Publishing Company, Inc., Reading, Massachusetts, 1978).Google Scholar
[13] Detor, AJ, Miller, MK, Schuh, CA, Phil. Mag. Submitted for review, (2006).Google Scholar
[14] Lund, AC, Schuh, CA, Acta Mater. 53, 3193 (2005).Google Scholar
[15] Palumbo, G, Thorpe, SJ, Aust, KT, Scripta Metall. Mater. 24, 1347 (1990).Google Scholar
[16] Ishida, K, J Alloys and Comp. 235, 244 (1996).Google Scholar