Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-29T07:35:55.207Z Has data issue: false hasContentIssue false
  • English
  • Français

An Atom Probe Field Ion Microscope Investigation Of The Role Of Boron In Precipitates And At Grain Boundaries In NiAl

Published online by Cambridge University Press:  25 February 2011

Raman Jayaram  and
M. K. Miller
Raman Jayaram
Affiliation:
Metals and Ceramics Division Oak Ridge National Laboratory Oak Ridge, TN 37831–6376
M. K. Miller
Affiliation:
Metals and Ceramics Division Oak Ridge National Laboratory Oak Ridge, TN 37831–6376
Get access

Abstract

The high resolution analytical technique of Atom Probe Field Ion Microscopy (APFTM) haseen used to characterize grain boundaries and the matrix of a stoichiometric NiAl alloy doped with 0.04 (100 wppm) and 0.12 at. % (300 wppm) boron. Field ion images revealed boron segregation to the grain boundaries. Atom probe elemental analysis of the grain boundaries measured a boron coverage of up to 30% of a monolayer. Extensive atom probe analyses also revealed a fine dispersion of nanoscale boride precipitates in the matrix. The boron segregation to the grain boundaries was found to correlate with the observed suppression of intergranular fracture. However, the decrease in ductility of boron-doped NiAl is attributed in part to the precipitation hardening effect of the boride phases.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 238: Symposium Cb – Structure and Properties of Interfaces in Materials , 1991 , 445
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Hahn, K.H. and Vedula, K., Scripta Metall., 23, 7 (1987).Google Scholar
2. Aoki, K. and Izumi, O., J. Jpn. Inst. Met., 43, 1190, (1979).CrossRefGoogle Scholar
3. Liu, C.T., White, C.L. and Horton, J.A., Acta Metall., 33, 213, (1985).CrossRefGoogle Scholar
4. Miller, M.K. and Horton, J.A., Scripta Metall., 20, 789, (1986).Google Scholar
5. Horton, L.A. and Miller, M.K., Acta Metall., 35, 133, (1987)Google Scholar
6. George, E.P. and Liu, C.T., J. Mater. Res., 5, 754, (1990).6.CrossRefGoogle Scholar
7. Muller, E.W., Panitz, J.A. and McLane, S.B., Rev. Sci. Instrum., 39, 83, (1968).Google Scholar
8. Miller, M.K. and Smith, G.D.W., Atom Probe Microanalvsis: Principles and Applications to Materials Problems. (Materials Research Society Publishers, Pittsburgh, PA, 1989).Google Scholar
9. George, E.P., Liu, C.T. and Liao, J.J. in Alloy Phase Stability and Design, edited by Stocks, G.M., Pope, D.P. and Giamei, A.F. (Mater. Res. Soc. Proc. 186, Pittsburgh, PA 1991), pp. 375.Google Scholar
10. Alexander, K.B., Angelini, P. and Miller, M.K., J. de Physique, 50, C7–493, (1989).Google Scholar
11. Miller, M.K., J. de Physique. 47–C2. 493, (1986).Google Scholar
12. Bowkett, K.M. and Smith, D.A., Field Ion Microscopy. (North Holland, Amsterdam, 1970) p. 142.Google Scholar
13. Miller, M.K., J. de Physique, 48, C6–565, (1987).Google Scholar
14. Jayaram, R. and Miller, M.K., Surface Science, in press.Google Scholar