Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-19T06:50:31.503Z Has data issue: false hasContentIssue false

An Analysis of the Structure of Irradiation induced Cu-enriched Clusters in Low and High Nickel Welds

Published online by Cambridge University Press:  21 March 2011

Jonathan M. Hyde
Affiliation:
AEA Technology plc, B220 Harwell, Didcot, Oxon. OX11 0RA, UK
Colin A. English
Affiliation:
AEA Technology plc, B220 Harwell, Didcot, Oxon. OX11 0RA, UK
Get access

Abstract

Two high copper irradiated welds, one containing very low Ni and the other containing very high Ni, have been examined using 3-D atom probe (3DAP) microscopy, small angle neutron scattering (SANS) and field emission gun-scanning transmission electron microscopy (FEG- STEM).

Irradiation induced clusters were observed in both welds. They were found to be significantly smaller and exist at a higher number density in the high Ni weld. A new algorithm was developed to precisely identify the shape, composition and size of clusters observed in the atom probe data. Representative irradiation induced clusters from each weld were then examined in greater detail. They were shown to be ramified and have a significant Fe content (∼60at.%). Cu was found to be more strongly associated with the core of the clusters than Mn or Ni. In the low Ni weld, there was evidence for P at the interfaces between the clusters and matrix. Cluster composition estimates from FEG-STEM analyses were consistent with those observed by 3DAP microanalysis. For each weld, the mean radius of gyration of the clusters was found to be almost identical to the radius of gyration determined directly from SANS analyses of these materials. Finally, the number density of features was estimated from the SANS data by using the compositional information from the 3DAP observations. Consistency with the number density calculated directly from the 3DAP data was obtained provided that it is assumed that the clusters exhibit some magnetic properties.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Phythian, W.J., English, C.A., J. Nucl. Mater., 205 (1993) 162.Google Scholar
2 Odette, G.R., J. Nucl. Mater., 212–215(1994) 45.Google Scholar
3 Buswell, J.T., Phythian, W.J., McElroy, R.J., Dumbill, S., Ray, P., Mace, J. and Sinclair, R.N., J. Nucl. Mat. 225 (1995) 196214.Google Scholar
4 Odette, G.R., Mat Res. Symp. Proc., 373 (1995) 137.Google Scholar
5 Miller, M.K., Atom Probe Tomography, 2000, Kluwer Academic/Plenum Publishers, New York, NY.Google Scholar
6 Cerezo, A., Godfrey, T.J., Sijbrandij, S.J., Smith, G.D.W., Warren, P.J., Review of Scientific Instruments, 59 (1998) 862.Google Scholar
7 Miller, M.K., Pareige, P., and Burke, M.G., Materials Characterization, 44, (1999) 235.Google Scholar
8 Carter, R.G., Soneda, N., Dohi, K., Hyde, J.M., English, C.A. and Server, W., Submitted to J. Nucl. Mater. Google Scholar
9 Pareige, P., Stoller, R.E., Russell, K.F., Miller, M.K., J. Nucl. Mater., 249 (1997) 165.Google Scholar
10 Pareige, P., Miller, M.K., Appl. Surf. Sci., 94 & 95 (1996) 370.Google Scholar
11 Hyde, J.M., Computer modelling and analysis of microscale phase transformations, D. Phil Thesis, University of Oxford, Oxford, UK, 1993.Google Scholar
12 Windsor, C., J. Appl. Crystallogr. 21 (1988) 582588.Google Scholar
13 Blavette, D., Vurpillot, F., Pareige, P. and Menand, A., Accepted for publication in Ultramicroscopy, Proceedings of IFES (2000), Pittsburgh.Google Scholar
14 Potton, J.A., Daniell, G.J. and Rainford, B.D., J. Appl. Crystallogr. 21 (1988) 663.Google Scholar
15 Potton, J.A., Daniell, G.J. and Rainford, B.D., J. Appl. Crystallogr. 21 (1988) 891.Google Scholar
16 Sumiyama, K., Yoshitake, T., Nakamura, Y., J. Phys. Soc. Japan, 53 (1984) 3160.Google Scholar