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An Advanced Mechanical Dimpung Technique for the Preparation of TEM Specimens

Published online by Cambridge University Press:  16 February 2011

Paul E. Fischione  and
James M. Howe
Paul E. Fischione
Affiliation:
E. A. fischione Instruments, Inc., 216 Red Oak Drive, Pittsburgh, PA 15239
James M. Howe
Affiliation:
Department of Metallurgical Engineering and Materials Science, Carnegie Mellon University, Pittsburgh, PA 15213
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Abstract

For materials that are conducive to pre-thinning by mechanical techniques, a combination of dimpling and ion milling is commonly employed to produce TEM specimens. In order to minimize artifacts induced by ion milling and to provide an increased electron-beam transparent area, new instrumentation for mechanical thinning has been developed. Examples illustrating the utilization of this instrument in the preparation of cross-sectional interfaces from layered samples are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 199: Symposium W – Specimen Preparation for Transmission Electron Microscopy of Materials II , 1990 , 137
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

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