Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-29T10:35:26.431Z Has data issue: false hasContentIssue false

Amorphization of Zr3Al by Hydrogenation and Subsequent Electron Irradiation

Published online by Cambridge University Press:  25 February 2011

W. J. Meng
Affiliation:
MATERIALS SCIENCE DIVISION, ARGONNE NATIONAL LABORATORY ARGONNE, ILLINOIS 60439
J. Koike
Affiliation:
MATERIALS SCIENCE DIVISION, ARGONNE NATIONAL LABORATORY ARGONNE, ILLINOIS 60439
P. R. Okamoto
Affiliation:
MATERIALS SCIENCE DIVISION, ARGONNE NATIONAL LABORATORY ARGONNE, ILLINOIS 60439
L. E. Rehn
Affiliation:
MATERIALS SCIENCE DIVISION, ARGONNE NATIONAL LABORATORY ARGONNE, ILLINOIS 60439
Get access

Abstract

1-MeV electron irradiation of hydrogenated Zr3Al (Zr3AlH0.96) at 10K is studied. A more than 20 fold reduction in the critical dose required for complete amorphization is observed for the hydrogenated specimen as compared to the un-hydrogenated Zr3Al under identical irradiation conditions.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Rehn, L. E., Okamoto, P. R., Pearson, J., Bhadra, R., and Grimsditch, M., Phys. Rev. Lett. 59, 2987 (1987).Google Scholar
2. Okamoto, P. R., Rehn, L. E., Pearson, J., Bhadra, R., and Grimsditch, M., J. Less-Common Met. 140, 231 (1988).Google Scholar
3. Meng, W. J., Okamoto, P. R., Thompson, L. J., Kestel, B. J., and Rehn, L. E., Appl. Phys. Lett. 53, 1820 (1988).10.1063/1.100481Google Scholar
4. Koike, J., Okamoto, P. R., Rehn, L. E., and Meshii, M., submitted to Met. Trans. (1988).Google Scholar
5. Luzzi, D. E. and Meshii, M., Res Mechanica 21, 207 (1987).Google Scholar
6. Kestel, B. J., Ultramicroscopy 19, 205 (1986).CrossRefGoogle Scholar
7. Oen, O. S., Cross Sections for Atomic Displacements in Solids by Fast Electrons, ORNL-Rep. No. 4897 (1973).CrossRefGoogle Scholar
8. Meng, W. J., Okamoto, P. R., Kestel, B. J., Thompson, L. J., and Rehn, L. E., submitted to Phys. Rev. B (1988).Google Scholar
9. Regnier, P. G., Lam, N. Q., and Westmacott, K. H., J. Nucl. Mater. 115, 286 (1983).CrossRefGoogle Scholar
10. Corbett, J. W., Electron Radiation Damage in Semiconductors and Metals (Academic Press, New York, 1966).Google Scholar
11. Biersack, J. P. and Haggmark, L. G., Nucl. Instrum. Methods 174, 257 (1980).10.1016/0029-554X(80)90440-1Google Scholar