Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-25T17:44:00.878Z Has data issue: false hasContentIssue false
  • English
  • Français

Aluminum Incorporation in Cuprate Perovskites

Published online by Cambridge University Press:  28 February 2011

T. Siegrist ,
L. F. Schneemeyer ,
J. V. Waszczak ,
S. A. Sunshine ,
N. P. Singh ,
R. L. Opila ,
B. Batlogg ,
L. W. Rupp  and
D. W. Murphy
T. Siegrist
Affiliation:
AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, NJ 07974
L. F. Schneemeyer
Affiliation:
AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, NJ 07974
J. V. Waszczak
Affiliation:
AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, NJ 07974
S. A. Sunshine
Affiliation:
AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, NJ 07974
N. P. Singh
Affiliation:
AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, NJ 07974
R. L. Opila
Affiliation:
AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, NJ 07974
B. Batlogg
Affiliation:
AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, NJ 07974
L. W. Rupp
Affiliation:
AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, NJ 07974
D. W. Murphy
Affiliation:
AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, NJ 07974
Get access

Abstract

Aluminum incorporation in cuprate perovskite single crystals has been studied by single crystal x-ray diffraction. We find that Al substitutes for copper in the Cu-O chains only. Superconducting transition temperatures, Tc, determined by dc diamagnetic susceptibility measurements, change only slightly, to «80K for ×=0.l, then drop sharply with higher aluminum concentrations.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 99: Symposium AA – High-Temperature Superconductors , 1987 , 973
Copyright
Copyright © Materials Research Society 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Le Page, Y., Siegrist, T., Sunshine, S. A., Schneemeyer, L. F., Murphy, D. W., Zahurak, S. M., Waszczak, J. V., McKinnon, W. R., Tarascon, J. M., Hull, G. W., and Greene, L. H., Phys. Rev. B 36, 3617 (1987)Google Scholar
2. Provost, J., Studer, F., Michel, C., and Raveau, B., Synth. Met. 4, 147 (1981)Google Scholar
3. Xiao, G., Streitz, F. H., Gavrin, A., Du, Y. W., and Chien, C. L., Phys. Rev. B 35, 8782 (1987)Google Scholar
4. Matsushita, A., Aoki, H., Asada, Y., fiatano, T., Kimura, K., Matsumoto, T., Nakamura, K., and Ogawa, K., preprint.Google Scholar
5. Schneemeyer, L. F., Waszczak, J. V., Siegrist, T., van Dover, R. B., Rupp, L. W., Batlogg, B., Cava, R. J., and Murphy, D. W., Nature, August 15, 1987.Google Scholar
6. Le Page, Y., White, P. S., and Gabe, E. J., Proc. Amer. Cryst. Assoc. Meeting, 1986, Hamilton, Abstract 61.Google Scholar
7. Gabe, E. J., Lee, F. L., and Le Page, Y., in Crystallographic Computing 3, edited by Sheldrick, G. H., Kruger, C, and Goddard, R.), Clarendon Press, Oxford, p. 163 (1985).Google Scholar