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AFM Analysis Of Nano-Copper Surface Morphology
Published online by Cambridge University Press: 01 February 2011
Abstract
Surface morphology and features of pure copper heavily deformed by equal channel angular pressing were studied by means of an atomic force microscope (AFM) and scanning electron microscope (SEM) techniques. Surface characterization helps to develop a better understanding of microstructure evolution of materials subjected to any kind of mechanical loading and thermal treatment. The main objectives of this study are to exploit the capabilities of AFM to accurately perform an analysis of the surface features of nano-structured copper subjected to plastic deformation and heat treatment; and examination of the mechanical characteristics influenced by material's microstructure. It is shown that the AFM technique can be extremely useful for the investigations of a surface topography of materials.
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- Copyright © Materials Research Society 2005