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AFM Analysis Of Nano-Copper Surface Morphology

Published online by Cambridge University Press:  01 February 2011

Rynno Lohmus
Affiliation:
Department of Materials Engineering, Tallinn University of Technology Ehitajate tee 5, 19086 Tallinn, Estonia Institute of Physics, University of Tartu, Riia 142, 51014 Tartu, Estonia
Irina Hussainova
Affiliation:
Department of Materials Engineering, Tallinn University of Technology Ehitajate tee 5, 19086 Tallinn, Estonia
Lembit Kommel
Affiliation:
Department of Materials Engineering, Tallinn University of Technology Ehitajate tee 5, 19086 Tallinn, Estonia
Hele Siimon
Affiliation:
Department of Materials Engineering, Tallinn University of Technology Ehitajate tee 5, 19086 Tallinn, Estonia Institute of Physics, University of Tartu, Riia 142, 51014 Tartu, Estonia
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Abstract

Surface morphology and features of pure copper heavily deformed by equal channel angular pressing were studied by means of an atomic force microscope (AFM) and scanning electron microscope (SEM) techniques. Surface characterization helps to develop a better understanding of microstructure evolution of materials subjected to any kind of mechanical loading and thermal treatment. The main objectives of this study are to exploit the capabilities of AFM to accurately perform an analysis of the surface features of nano-structured copper subjected to plastic deformation and heat treatment; and examination of the mechanical characteristics influenced by material's microstructure. It is shown that the AFM technique can be extremely useful for the investigations of a surface topography of materials.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

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