Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-25T15:22:01.523Z Has data issue: false hasContentIssue false

Advancements in Dimpling Technique for Automatically and Repeatably Thinning TEM Samples to Near Electron Transparency

Published online by Cambridge University Press:  21 February 2011

Vincent L. Caruino
Affiliation:
VCR Group, Inc., 250 E. Grand Ave., Suite 31, So. San Francisco, CA 94080
August J. Hidalgo
Affiliation:
VCR Group, Inc., 250 E. Grand Ave., Suite 31, So. San Francisco, CA 94080
Get access

Extract

One of the latest advancements in technique for preparing materials for TEM examination was first made commercially available by VCR Group in 1982. The instrument, known as the DIMPLER®, mechanically thins materials by “dimpling”, a technique which has become widely accepted by material scientists. Since its inception other manufacturers have also produced dimpler-like instruments.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. King, W.E. and Peterson, N.L. and Reddy, J.F., Applications of Transverse-Section Analytical Electron Microscopy to the Study of Oxidation and Metal Alloys, Materials Science and Technology Division, Argonne National Laboratory, Argonne, IL 60439, U.S.A.Google Scholar
2. Bravman, J.C. and Sinclair, R., The Preparation of Cross-Sectional Specimens for Transmission Electron Microscopy, J. Mater. Res. 1:5361 (1984)Google Scholar
3. Plummer, H.K. and Shinozaki, S.S., Mechanical Microthinning: An Alternative to Chemical or Ion Beam Thinning for TEM Specimen Preparation, In: Proceedings of the 42nd Annual Meeting of EMSA, G.W. Bailey, ed. San FranciscoGoogle Scholar
4. Madden, M.C. and Crafard, P., A Variation of Transmission Electron Microscope Sample Preparation for VLSI Analysis, J. Electron Microscopy Technique 11:161166 (1989)Google Scholar