Hostname: page-component-78c5997874-lj6df Total loading time: 0 Render date: 2024-11-09T14:26:41.314Z Has data issue: false hasContentIssue false

Advanced Interactive Personal Computer-Based Process Control Systems for Oxide MOCVD Systems.

Published online by Cambridge University Press:  10 February 2011

G.S. Tompa
Affiliation:
Structured Materials Industries, Incorporated, 120 Centennial Avenue, Piscataway, NJ 08854, B. Gallois, Stevens Institute of Technology, Hoboken, NJ 07030, S. Liang, C.R. Gorla and Y. Chen, Rutgers University, Piscataway, NJ 08854
D. Shen
Affiliation:
Structured Materials Industries, Incorporated, 120 Centennial Avenue, Piscataway, NJ 08854, B. Gallois, Stevens Institute of Technology, Hoboken, NJ 07030, S. Liang, C.R. Gorla and Y. Chen, Rutgers University, Piscataway, NJ 08854
C. Zhang
Affiliation:
Structured Materials Industries, Incorporated, 120 Centennial Avenue, Piscataway, NJ 08854, B. Gallois, Stevens Institute of Technology, Hoboken, NJ 07030, S. Liang, C.R. Gorla and Y. Chen, Rutgers University, Piscataway, NJ 08854
I.H. Murzin
Affiliation:
Structured Materials Industries, Incorporated, 120 Centennial Avenue, Piscataway, NJ 08854, B. Gallois, Stevens Institute of Technology, Hoboken, NJ 07030, S. Liang, C.R. Gorla and Y. Chen, Rutgers University, Piscataway, NJ 08854
Get access

Abstract

A versatile control system, which uses standard commercial software and hardware has been developed and applied to control oxide (and carbide) MOCVD and CVD systems. The control system is implemented within a personal computer platform. The system operates in the real time Microsoft WindowsTM environment utilizing the full advantage of the sophisticated graphical user interfaces, dynamic data exchange, networking, and multitasking capabilities. We have used two different sets of commercial software to control and monitor system hardware. The first software set is INTOUCHTM, a Man-Machine interface software from WONDERWARETM in conjunction with Microsoft ExcelTM and I/O interface software. The second software set is LABVIEWTM, which is primarily a data acquisition control system from National Instruments, combined with Visual BasicTM. Both systems include a friendly interactive real-time windows-based user interface, an advanced process entry and recording spread sheet interface, alarm and security management systems, data display and recording, maintenance routines, and complete networking and remote operation capabilities. In addition, the configurations provide a flexible hardware interface that can directly interface to I/O cards in the PC's bus, as well as to most industrial Programmable Logic Controllers, various types of process controllers, I/O devices and other forms of hardware. Most importantly, the system can interface with any in-situ process monitor or higher level intelligent process control systems in order to optimize the process. Modules may be activated or deactivated as needed (even as part of the process). These systems have been used for home-built systems, as well as to retrofit a modified Spire SPI-MOCVDTM 500XT system. General process interaction and results will be discussed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Stark, E.F. and Laube, S.J.P., Valencia, Spain, 5 Oct. 1994. ASC-94-0099.Google Scholar
2. Laube, S.J.P., Dissertation submitted to the Division of Research and Advanced Studies for the University of Cincinnati, Cincinnati, OH, 15 Feb 1994.Google Scholar
3. Garrett, P.H., Heyob, J.J., Hunt, V.J., LeClair, S.R. and Patterson, O.D., IEEE Transactions on Semiconductor Manufacturing. Vol.6, No. 4, November 1993, pp 348356. ASD Case No. 92–0023Google Scholar
4. Stark, E.F. and Laube, S.J.P., Vol. 2, Issue 5, ASM International, Oct 1993, pp 721726.Google Scholar
5. Aixtron GMHB, product literature; EMCORE Corp., product literature; and Spire Corp. product literature.Google Scholar
6. Gorla, C. et al. and Forsythe et al., presented at 1995 MRS Meeting, Boston, Symposium K (11.5 and 7.17).Google Scholar
7. Tompa, G.S., Morton, D.C., Sywe, B.S., Lu, Y., Forsythe, E.W., Ott, J.A., Smith, D., Khurgin, J., Khan, B.A., Mat. Res. Soc. Proceedings, Symp. F 12/94, Vol.358, (1995), 701.Google Scholar
8. Wagner, R. in “Whisker Technology,” ed. Levitt, A.P., Wiley Interscience, NY, 1970.Google Scholar
9. Gallois, B.M., Li, Y.Q. and Kim, C.B., unpublished results.Google Scholar