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Adjacent Layer Composition Effects on Fetbco Thin Film Magnetic Properties

Published online by Cambridge University Press:  15 February 2011

Michael B. Hintz*
Affiliation:
Imaging and Electronics Sector Materials Application Laboratory, 3M Co., St. Paul, MN 55144
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Abstract

The magneto-optical (MO) layer in current rare earth-transition metal (RE-TM) based MO recording media is typically 20 nm to 60 nm thick. It has been suggested, however, that media structures employing a multiplicity of thinner MO layers may be advantageous, e.g., for multilevel recording applications [1] or media noise reduction [2]. As magnetic layer thickness is reduced, interactions among magnetic layers and adjacent materials can have an increasingly large influence on magnetic properties; in many instances, these interactions can dominate the observed magnetic behavior.

As a means of studying MO layer - adjacent layer interactions, we have used thin (≈3 nm) films of several materials to separate single 24 nm thick ion-beam-deposited FeTbCo layers into N thinner layers of 24/N nm thickness (N × 24/N). As N increases, the FeThCo magnetic properties generally change; however, the relative magnitude of the changes is strongly dependent upon the adjacent layer composition. Magnetization (Ms), energy product (MsHc) at 30 C and Curie temperature data for 1 × 24 nm structures and 6 × 4 nm structures are compared and discussed for specimens employing SiCx, Six, YOx, HfOx, Si and SiOx adjacent layer materials.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

1. Saito, N. et al. , Jap. J. Appl. Phys. 28, supplement 28-3, 343 (1989).Google Scholar
2. Lin, C.-J., Appl. Phys. Lett. 62, 636 (1993).Google Scholar
3. Falicov, L. M. et al. , J. Mater. Res. 5, 1299 (1990).Google Scholar
4. Sato, N., J. Appl. Phys. 59, 2514 (1986).Google Scholar
5. Callaby, D. R., Lorentz, R. D. and Yatsuya, S., J. Appl. Phys. 75, 6843 (1994).Google Scholar
6. Thornton, J. A., Ann. Rev. Mater. Sci. 7, 239 (1977).Google Scholar
7. Anthony, T. C., Brug, J., Naberhuis, S., and Birecki, H., J. Appl. Phys. 59, 213 (1986).Google Scholar
8. Yang, M. M. and Reith, T. M., J. Appl. Phys. 71, 3945 (1992).Google Scholar
9. Eyring, L., Handbook on the Physics and Chemistry of Rare Earths, edited by Gschneidner, K. A. and Eyring, L. (North-Holland Publishing, 1979), p. 368.Google Scholar
10. Handbook of Chemistry and Physics, 74th ed, edited by Lide, D. R. (CRC press, 1993).Google Scholar
11. Bozorth, R. M., Ferromagnetism (Van Nostrand Company, 1978) p 71.Google Scholar
12. Hoshi, Y. and Naoe, M., J. Appl. Phys. 69, 5622 (1991).Google Scholar
13. Hellman, F. and Gyorgy, E. M., Phys. Rev. Let. 68, 1391 (1992).Google Scholar