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Ac Permeability Measurements in 770 MeV 129Xe17+ and 560 MeV 16O6+ Irradiated YBa2Cu3O7

Published online by Cambridge University Press:  26 February 2011

J. Bechtold
Affiliation:
Texas Center for Superconductivity, University of Houston, Houston, TX 77204–5932.
X. C. Jin
Affiliation:
Texas Center for Superconductivity, University of Houston, Houston, TX 77204–5932.
Y. Y. Xue
Affiliation:
Texas Center for Superconductivity, University of Houston, Houston, TX 77204–5932.
I. A. Rusakova
Affiliation:
Texas Center for Superconductivity, University of Houston, Houston, TX 77204–5932.
E. V. Hungerford
Affiliation:
Texas Center for Superconductivity, University of Houston, Houston, TX 77204–5932.
H. Feng
Affiliation:
Texas Center for Superconductivity, University of Houston, Houston, TX 77204–5932.
P. H. Hor
Affiliation:
Texas Center for Superconductivity, University of Houston, Houston, TX 77204–5932.
C. W. Chu
Affiliation:
Texas Center for Superconductivity, University of Houston, Houston, TX 77204–5932.
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Abstract

High-energy heavy-ion irradiation has been shown to be effective in introducing flux-pinning defects in Y123 single crystals. Contrary to electron, low energy proton, and fast neutron irradiation, high-energy heavy-ion irradiation produces defects beneficial to flux pinning through the electronic (rather than nuclear) stopping mechanism. This type of stopping results in tubular defects many microns long that can increase the range of irreversible magnetic behavior to higher fields. In contrast, dense arrays of small defects (size < 100 Ang.) produce enhanced critical currents at low fields but do not extend the range of irreversible behavior significantly. We have used two ion-energy combinations in which the electronic stopping powers vary by nearly two orders of magnitude. The difference in stopping powers results in very different defect types, ranging from well oriented and dense (Xe) to much less well oriented and shorter (O) tubular defects. A novel analysis of the ac μ data indicates that the strong pinning introduced by the Xe irradiation breaks the vortex glass picture in favor of an individual pinning model, while O irradiation does not.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

1. Koch, R. H., Fogletti, V., Gallagher, W. J., Koren, G., Gupta, A., and Fisher, M. P. A., Phys. Rev. Lett. 63, 1511(1989).Google Scholar
2. Gammel, P. L., Shneemeyer, L. F., and Bishop, D. J., Phys. Rev. Lett, 66, 953(1991).Google Scholar
3. Gao, L., Xue, Y. Y., Hor, P. H., and Chu, C. W., Physica C 177, 438(1991).Google Scholar
4. Fisher, D. S., Fisher, M. P. A., Huse, D. A., Phys. Rev. B 43, 130(1991).Google Scholar
5. Malozemoff, A. P., Worthington, T. K., Yeshurun, Y., Holtzberg, F., and Kes, P. H., Phys. Rev. B 38, 203(1988).Google Scholar
6. Sagdahl, L. T., Gjolmesli, S., Laegreid, T., Fossheim, K., and Assmus, W., Phys. Rev. B 42, 6797 (1990).Google Scholar
7. Jin, X. C., Xue, Y. Y., Huang, Z. J., Bechtold, J., Hor, P. H., and Chu, C. W., submitted to Phys. Rev. B.Google Scholar
8. Civaie, L., Marwick, A. D., Worthington, T. K., Kirk, M. A., Thompson, J. R., Krusin-Elbaum, L., Sun, Y., Clem, J. R., and Holtzberg, F., Phys. Rev. Lett. 67, 648(1991).Google Scholar
9. Gao, L., Meng, R. L., Xue, Y. Y., Hor, P. H., and Chu, C. W., Appl. Phys. Lett. 58, 1(1991).Google Scholar
10. Ziegler, J. F., Biersack, J. P., and Littmark, U., The Stopping and Range of Ions in Solids (Pergamon, New York, 1985).Google Scholar
11. Geshkenbein, V. B., Vinokur, V. M., and Fehrenbacher, R., Phys. Rev. B 43, 458(1991).Google Scholar
12. Clem, J. R., J. Appl. Phys. 50, 3518(1979).Google Scholar
13. Xue, Y. Y., Huang, Z. J., Hor, P. H., and Chu, C. W., Phys. Rev. B 43, 13598(1991).Google Scholar