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xsCharacterisation of Overglaze Painting on Japanese Porcelain Using Scanning Proton and Electron Microprobes

Published online by Cambridge University Press:  26 February 2011

Raik Jarjis ,
Peter Northover  and
Irene Finch
Raik Jarjis
Affiliation:
Nuclear Physics Laboratory, University of Oxford, OXFORD, OXI 3RH, UK
Peter Northover
Affiliation:
Department of Materials, University of Oxford, Parks Road, OXFORD, OXI 3PH, UK
Irene Finch
Affiliation:
67a Wallwood Road, LONDON, ElI lAY, UK
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Abstract

The scanning proton microprobe and electron microprobe/microscope are used to characterise overglaze painting on 18th and 19th century Japanese porcelain. The first objective was to distinguish between two apparently different types of gold painting in terms of particle size, composition and application. The multi-element X-ray mapping and analysis using proton-induced X-ray emission and the depth profiling possible using Rutherford back-scattering on the scanning proton probe make simplify the analysis of the structure of complex decorative schemes involving several pigments. First results and future developments are presented.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 352: Symposium – Materials Issues in Art and Archaeology IV , 1995 , 143
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

1. Hunt, L.B., Gold Bulletin, 12(3), 116–127 (1979)Google Scholar
2. Père d'Entrecolles, Leters, tr. in Tichane, R., , Ching-te-Chen: views of a porcelain city, (New York State Institute for Glaze Research, 1983), 49–128 Google Scholar
3. Demortier, G., Nuclear Instruments and Methods, B54, 334–345 (1991)Google Scholar
4. Swann, C.P. and Fleming, S.J., Proton-induced X-ray emission spectrometry in archaeology, in Scanning Microscopy, 2, 197–207 (1988)Google Scholar
5. Jarjis, R.A., Ion-beam archaeometry: technological assessment of ancient and medieval materials, in Application of particles and laser beams in materials technology, (Kluwer, NATO ASI Series, Dordrecht, in press)Google Scholar
6. Grime, G.W., Dawson, M., Marsh, M., MacArthur, I.C. and Watt, F., Nuclear Instruments and Methods, B54, 52–63 (1991)Google Scholar
7. Clayton, E.J., Pixan, the Lucas Heights PIXE analysis package, Australian Atomic Energy Commission report, AEC/M113 (1986)Google Scholar
8. Grime, G.W., Watt, F., Duval, A.R. and Menu, M., Nuclear Instruments and Methods, B54, 353–362 (1991)Google Scholar
9. Jarjis, R.A., Nuclear Instruments and Methods, 160, 457–460 (1979)Google Scholar
10. Beck, L., Barrandon, N.J. and Gratuze, B., A non-destructive method of characterisation of plating depth profiles using the PIGE technique, in Archaeometry '90, edited by Pernicka, E. and Wagner, G.A. (Birkhuaser Verlag, Basel, 1991), 1–10 Google Scholar
11. Jarjis, R.A., Journ. Analytic. Chem., 48, 311–15 (1979)Google Scholar
12. Doolittle, L. and Thompson, M., RUMP RBS simulation program, (Ithaca, Materials Science and Engineering Dept., Bard Hall, Cornell University, 1990)Google Scholar
13. Scott, R.E., Chinese overglaze enamelled porcelain: styles, subjects and science, in International Ceramics Fair and Seminar: Proceedings (London, 1992)Google Scholar