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X-ray Topography to Characterize Surface Damage on CdZnTe Crystals

Published online by Cambridge University Press:  01 February 2011

David Black ,
Joseph Woicik ,
Martine C. Duff ,
Douglas B. Hunter ,
Arnold Burger  and
Michael Groza
David Black
Affiliation:
[email protected], NIST, Ceramics, 100 Bureau Dr, Stop 8520, Gaithersburg, MD, 20899, United States
Joseph Woicik
Affiliation:
[email protected], NIST, Gaithersburg, MD, 20899, United States
Martine C. Duff
Affiliation:
[email protected], SRNL, Aiken, SC, 29808, United States
Douglas B. Hunter
Affiliation:
[email protected], SRNL, Aiken, SC, 29808, United States
Arnold Burger
Affiliation:
[email protected], Fisk University, Nashville, TN, 37208, United States
Michael Groza
Affiliation:
[email protected], Fisk University, Nashville, TN, 37208, United States
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Abstract

Synthetic CdZnTe or “CZT” crystals can be used for room temperature detection of α- and γ-radiation. Structural/morphological heterogeneities within CZT, such as twinning, secondary phases (often referred to as inclusions or precipitates), and polycrystallinity can affect detector performance. As part of a broader study using synchrotron radiation techniques to correlate detector performance to microstructure, x-ray topography (XRT) has been used to characterize CZT crystals. We have found that CZT crystals almost always have a variety of residual surface damage, which interferes with our ability to observe the underlying microstructure −for purposes of crystal quality evaluation. Specific structures are identifiable as resulting from fabrication processes and from handling and shipping of sample crystals. Etching was found to remove this damage; however, our studies have shown that the radiation detector performance of the etched surfaces was inferior to the as-polished surface due to higher surface currents which result in more peak tailing and less energy resolution. We have not fully investigated the effects of the various types of inducible damage on radiation detector performance.

Keywords

x-ray diffraction (XRD)defectsmicrostructure
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1038: Symposium O – Nuclear Radiation Detection Materials , 2007 , 1038-O04-03
Copyright
Copyright © Materials Research Society 2008

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