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X-ray Microscopy of Polymeric Materials

Published online by Cambridge University Press:  15 February 2011

H. Adel ,
B. Hsiao ,
G. Mitchell ,
E. Rightor ,
A. P. Smith  and
R. Cieslinski
H. Adel
Affiliation:
Dept. of Physics, North Carolina State University, Raleigh, NC 27695–8202
B. Hsiao
Affiliation:
Experimental Station, DuPont, Wilmington, DE 19880–0302
G. Mitchell
Affiliation:
Analytical Science Laboratory, Dow Chemical, Midland, MI 48667
E. Rightor
Affiliation:
Texas Polymer Center, B-1470, Dow Chemical, Freeport, TX 77541
A. P. Smith
Affiliation:
Dept. of Physics, North Carolina State University, Raleigh, NC 27695–8202
R. Cieslinski
Affiliation:
Experimental Station, DuPont, Wilmington, DE 19880–0302
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Abstract

We describe how the scanning transmission x-ray microscope at Brookhaven National Laboratory can be used to investigate the bulk characteristics of polymeric materials with chemical sensitivity at a spatial resolution of about 50 nm. We present examples ranging from unoriented multiphase polymers to highly oriented Kevlar fibers. In the case of oriented samples, a dichroism technique is used to determine the orientation of specific chemical bonds. Extension of the technique to investigate surfaces of thick samples is discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 375: Symposia AA – Applications of Synchrotron Radiation Techniques to Materials Science , 1994 , 293
Copyright
Copyright © Materials Research Society 1995

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References

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