Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Buttard, D.
Bellet, D.
Dolino, G.
and
Baumbach, T.
1998.
Thin layers and multilayers of porous silicon: X-ray diffraction investigation.
Journal of Applied Physics,
Vol. 83,
Issue. 11,
p.
5814.
Chamard, V
Dolino, G
Lérondel, G
and
Setzu, S
1998.
X-ray diffraction and reflectometry studies of porous silicon:.
Physica B: Condensed Matter,
Vol. 248,
Issue. 1-4,
p.
101.
Krüger, M
Hilbrich, S
Thönissen, M
Scheyen, D
Theiß, W
and
Lüth, H
1998.
Suppression of ageing effects in porous silicon interference filters.
Optics Communications,
Vol. 146,
Issue. 1-6,
p.
309.
Buttard, D
Dolino, G
Bellet, D
Baumbach, T
and
Rieutord, F
1998.
X-ray reflectivity investigation of thin p-type porous silicon layers.
Solid State Communications,
Vol. 109,
Issue. 1,
p.
1.
Lomov, A. A.
Bushuev, V. A.
and
Karavanskii, V. A.
2000.
Study of surface and interface roughnesses in porous silicon by high-resolution X-ray methods.
Crystallography Reports,
Vol. 45,
Issue. 5,
p.
842.
Sama, S
Ferrero, C
Lequien, S
Milita, S
Romestain, R
Servidori, M
Setzu, S
and
Thiaudière, D
2001.
Porous silicon characterization by x-ray reflectivity: problems arising from using a vacuum environment with synchrotron beam.
Journal of Physics D: Applied Physics,
Vol. 34,
Issue. 6,
p.
841.
Lomov, A. A.
Bushuev, V. A.
Karavanskii, V. A.
and
Bayliss, S.
2003.
Characterization of the structure of porous germanium layers by high-resolution X-ray diffractometry.
Crystallography Reports,
Vol. 48,
Issue. 2,
p.
326.
Karavanskii, V.A
Lomov, A.A
Sutyrin, A.G
Bushuev, V.A
Loikho, N.N
Melnik, N.N
Zavaritskaya, T.N
and
Bayliss, S
2003.
Raman and X-ray studies of nanocrystals in porous stain-etched germanium.
Thin Solid Films,
Vol. 437,
Issue. 1-2,
p.
290.
Gaillet, M.
Guendouz, M.
Ben Salah, M.
Le Jeune, B.
and
Le Brun, G.
2004.
Characterisation of porous silicon composite material by spectroscopic ellipsometry.
Thin Solid Films,
Vol. 455-456,
Issue. ,
p.
410.
Errien, N.
Vellutini, L.
Louarn, G.
and
Froyer, G.
2007.
Surface characterization of porous silicon after pore opening processes inducing chemical modifications.
Applied Surface Science,
Vol. 253,
Issue. 17,
p.
7265.
Sun, Xiao
Parish, Giacinta
and
Keating, Adrian
2017.
Fabrication of uniform porosity, all-porous-silicon microstructures and stress/stress gradient control.
Journal of Micromechanics and Microengineering,
Vol. 27,
Issue. 4,
p.
044001.
Konin, K. P.
Gudymenko, O. Yo.
Klad’ko, V. P.
Lytvynenko, O. O.
and
Morozovs’ka, D. V.
2018.
Generation and Auto-Revealing of Dislocations in Si During Macropore Etching.
Journal of Electronic Materials,
Vol. 47,
Issue. 9,
p.
5113.
Kim, Dongwoo
Lim, Hojoon
Ha, Sung Soo
Seo, Okkyun
Lee, Sung Su
Kim, Jinwoo
Kim, Ki-jeong
Perez Ramirez, Lucia
Gallet, Jean-Jacques
Bournel, Fabrice
Jo, Ji Young
Nemsak, Slavomir
Noh, Do Young
and
Mun, Bongjin Simon
2020.
Correlation between structural phase transition and surface chemical properties of thin film SrRuO3/SrTiO3 (001).
The Journal of Chemical Physics,
Vol. 152,
Issue. 3,