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The XPS Searchlight Effect: A New Analytical Tool for Layered Structures, Epitaxy, and Interfaces
Published online by Cambridge University Press: 26 February 2011
Abstract
Enhanced core-level peak intensities at angles corresponding to the internuclear axes among the near surface atoms is a characteristic feature of angle resolved XPS. This phenomenon, which is due to constructive interference in forward scattering of photoelectrons, acts, in effect, as a search-light allowing relatively easy mapping out of the structural arrangement atoms in the near-surface region. Examples which illustrate the usefulness of the XPS searchlight effect are presented.
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- Copyright © Materials Research Society 1985
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