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VUV and Soft X-ray Spectroscopy of Actinides

Published online by Cambridge University Press:  01 February 2011

Clifford G. Olson ,
John J. Joyce ,
Tomasz Durakiewicz ,
Elzbieta Guziewicz  and
Martin Butterfield
Clifford G. Olson
Affiliation:
Ames Laboratory, Iowa State University, Ames, Iowa 50011
John J. Joyce
Affiliation:
Los Alamos National Laboratory, Los Alamos, New Mexico 87545
Tomasz Durakiewicz
Affiliation:
Los Alamos National Laboratory, Los Alamos, New Mexico 87545
Elzbieta Guziewicz
Affiliation:
Los Alamos National Laboratory, Los Alamos, New Mexico 87545
Martin Butterfield
Affiliation:
Los Alamos National Laboratory, Los Alamos, New Mexico 87545
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Abstract

Optical and photoelectron spectroscopies using VUV and Soft X-ray photons are powerful tools for studies of elemental and compound actinides. Large changes in the relative atomic cross sections of the 5f, 6d and sp electrons allow decomposition of the character of the valence bands using photoemission. Resonant enhancement of photoelectrons and Auger electrons at the 5d core threshold further aids the decomposition and gives a measure of elemental specificity. Angle-resolved photoemission can be used to map the momentum dependence of the electronic states. The large changes in relative cross section with photon energy yields further details when the mapping is done at equivalent points in multiple zones. Spectra for well understood rare earth materials will be presented to establish spectral characteristics for known atomic character initial states. These signatures will be applied to the case of USb to investigate f-d hybridization near the Fermi level.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 802: Symposium DD – Actinides - Basic Science, Applications, and Technology , 2003 , DD2.5
Copyright
Copyright © Materials Research Society 2004

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References

REFERENCES

1. Yeh, J.J. and Lindau, I., At. Data Nucl. Data Tables 32, 1 (1985)Google Scholar
2. See for example: Allen, J.W., in Bachrach, R.Z. (Ed.), Synchrotron Radiation Research: Advances in Surface and Interface Science, Vol. 1; Techniques, Plenum Press, New York, 1992, p. 253.Google Scholar
3. Olson, C.G., Wu, X., Chen, S-L. and Lynch, D.W., Phys. Rev. Lett. 74, 992 (1995).Google Scholar
4. Zangwill, A. and Soven, Paul, Phys. Rev. Lett. 45, 204 (1980).Google Scholar
5. Olson, C.G., Benning, P.J., Schmidt, M., Lynch, D.W., Canfield, P. and Wieliczka, D.M., Phys. Rev. Lett. 76 4265 (1996).Google Scholar
6. Durakiewicz, T., Joyce, J.J., Lander, G.H., Olson, C.G., Butterfield, M.T., Guziewicz, E., Arko, A.J., Moore, D.P., Morales, L., Wastin, F., Rebizant, J., Mattenberger, K., and Vogt, O., PRB submitted, and this Symposium.Google Scholar
7. Lynch, D.W. and Cowan, R.D., Phys. Rev. B, 36, 9228 (1987) andGoogle Scholar
Olson, C. G., Chase, S.J., Canfield, P. and Lynch, D.W., J. of Elec. Spec. and Rel. Phenom., 93, 175 (1998).Google Scholar