No CrossRef data available.
Article contents
Visualizing Langmuir-Blodgett Films with the Atomic Force Microscope
Published online by Cambridge University Press: 21 February 2011
Abstract
The Atomic Force Microscope (AFM) has created exciting new possibilities for imaging thin organic films under ambient conditions at length scales ranging from tens of microns to the sub - molecular scale. We present images of thin organic films prepared by the Langmuir-Blodgett (LB) technique that demonstrate the possibilities of the AFM.
- Type
- Research Article
- Information
- Copyright
- Copyright © Materials Research Society 1994
References
REFERENCES
2.
Bonnerot, A., Chollet, P.A., Frisby, H., and Hoclet, M., J. Chem. Phys.
97, 365 (1985);Google Scholar
3.
Garoff, S., Deckman, H.W., Dunsmuir, J.H., and Alvarez, M.S., J. Phys.
47, 701 (1986)CrossRefGoogle Scholar
5.
Peterson, I.R., Seitz, R., Krug, H., and Voigt-Martin, I., J. Phys. (France), 51, 1003 (1990)CrossRefGoogle Scholar
6.
Seul, M., Eisenberger, P., and McConnell, H. M., Proc. Natl. Acad. Sci.
80, 5795 (1983); M. Prakash, P., J.B. Ketterson, and B.M. Abraham, Chem. Phys. Lett. 111,395 (1984)CrossRefGoogle Scholar
7.
Tippmann-Krayer, P., Kenn, R. M., and Mohwald, H., Thin Solid Films, 210, 577 (1992).CrossRefGoogle Scholar
9.
Fischetti, R. F., Skita, V., Garito, A. F., and Blasie, J. K., Phys. Rev. B
37, 4788 (1988); S. Xu, A. Murphy, S.M. Amador, and J.K. Blasie, J. Phys. I (France), 1, 1131 (1991)CrossRefGoogle Scholar
10.
Skita, V., Richardson, W., Filiplowski, M., Garito, A., and Blasie, J.K., J. Phys., 47, 1849 (1986); V. Skita, M. Filipkowski, A. F. Garito, and J. K. Blasie, Phys. Rev B., 34, 5826 (1986)CrossRefGoogle Scholar
12.
Outka, D.A., Stöhr, J., Rabe, J.P., Swalen, J.D., and Rotermund, H.H., Phys. Rev. Lett.
59, 1321 (1987)CrossRefGoogle Scholar
14.
Rothberg, L., Higashi, G.S., Allara, D.L., and Garoff, S., Chem. Phys. Lett.
133, 67 (1987); J.P. Rabe, J.D. Swalen, and J.F. Rabolt, J. Chem. Phys. 86, 1601 (1987); T. Nakanaga, M. Matsumoto, Y. Kawabata, H. Takeo, and C. Matsamura, Chem. Phys. Lett. 160, 129 (1989).CrossRefGoogle Scholar
15.
Stroeve, P., Srinivasan, M. P., Higgins, B. G., and Kowel, S. T., Thin Solid Films, 146, 209–216 (1987).CrossRefGoogle Scholar
16.
Maoz, R. and Sagiv, J., J. Coll. Inter. Sci., 100, 465 (1984); F. Kimura, J. Umemura, T. Takenaka, Langmuir, 2, 96 (1986); M. Shimomura, K. Song, and J.F. Rabolt, Langmuir, 8, 887 (1992)CrossRefGoogle Scholar
17.
Egger, M. et al, J. Struct. Biol., 103, 89 (1990); E. Meyer, et al, Nature 349, 398 (1991); J.A.N. Zasadzinski et al, Biophys. J. 59, 755 (1991); L. Bourdieu, P. Silberzan, and D. Chatenay, Phys. Rev. Lett. 67, 2029 (1991).CrossRefGoogle Scholar
18.
Smith, D. P. E. et al, Proc. Nat. Acad. Sci. USA, 84, 969–972 (1987); J. P. Rabe and S. Buchholz, Phys. Rev. Lett., 66, 2096-2099 (1991); J.K.H. Horber et al, Chem. Phys. Lett. 145, 151 (1988).CrossRefGoogle Scholar
19.
Hansma, H. G., Gould, S. A. C., Hansma, P. K., Gaub, H. E., Longo, M. L., and Zasadzinski, J. A. N., Langmuir, 7, 1051 (1991).CrossRefGoogle Scholar
20.
Viswanathan, R., Schwartz, D. K., Garnaes, J., and J. Zasadzinski, A. N., Langmuir, 8, 1603 (1992).CrossRefGoogle Scholar
21.
Garnaes, J., Schwartz, D.K., Viswanathan, R., and Zasadzinski, J.A.N., Nature, 357, 54 (1992).CrossRefGoogle Scholar
22.
Schwartz, D.K., Garnaes, J., Viswanathan, R., and Zasadzinski, J.A.N., Science
257, 508 (1992).CrossRefGoogle Scholar
23.
Schwartz, D.K., Garnaes, J., Viswanathan, R., Chiruvolu, S., and Zasadzinski, J.A.N., Phys. Rev. E
47, 452 (1993).CrossRefGoogle Scholar
24.
Viswanathan, R., Schwartz, D.K., and Zasadzinski, J.A.N., Science
261, 449 (1993).CrossRefGoogle Scholar
25.
Schwartz, D.K., Viswanathan, R., and Zasadzinski, J.A.N., J. Am. Chem. Soc., 115, 7374 (1993).CrossRefGoogle Scholar
26.
Schwartz, D.K., Viswanathan, R., and Zasadzinski, J.A.N., Phys. Rev. Lett.
70, 1267 (1993).CrossRefGoogle Scholar
27.
Schwartz, D.K., Viswanathan, R., and Zasadzinski, J.A.N., Langmuir
9, 1384 (1993).CrossRefGoogle Scholar
29. Millipore Corporation, Bedford, MA.Google Scholar
30. NIIMA Technology Ltd., Warwick Science Park, Coventry, CV4 7EZ, England.Google Scholar
31. Digital Intruments, Inc., Santa Barbara.Google Scholar
32.
Kitaigorodskii, A.I., Organic Chemical Crystallography, (Consultants Bureau, New York, 1961), Ch. 3.Google Scholar
36.
Steitz, R., Mitchell, E.E., and Peterson, I.R., Thin Solid Films
205, 124 (1991).CrossRefGoogle Scholar
37.
Schwartz, D.K., Schlossman, M.L., and Pershan, P.S., J. Chem. Phys.
96, 2356 (1992).CrossRefGoogle Scholar
38.
Prakash, M., Peng, J.B., Ketterson, J.B., and Dutta, P., Chem. Phys. Lett.
128, 354 (1986).CrossRefGoogle Scholar
40.
Halperin, B.I. and Nelson, D.R., Phys. Rev. Lett.
41, 121 (1978); D.R. Nelson and B.I. Halperin, Phys. Rev. B 19, 2457 (1979).CrossRefGoogle Scholar
44.
Pindak, R., Moncton, D.E., Davey, S.C., and Goodby, J.W., Phys. Rev. Lett.
46, 1135 (1981).CrossRefGoogle Scholar