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Variation in Tc and Carrier Concentration Caused by Change of Oxygen Content in Tl-Based Superconductors

Published online by Cambridge University Press:  28 February 2011

Y. Shimakawa
Affiliation:
Fundamental Research Laboratories, NEC Corporation 4–1–1 Miyazaki, Miyamae-ku, Kawasaki 213, Japan
Y. Kubo
Affiliation:
Fundamental Research Laboratories, NEC Corporation 4–1–1 Miyazaki, Miyamae-ku, Kawasaki 213, Japan
T. Manako
Affiliation:
Fundamental Research Laboratories, NEC Corporation 4–1–1 Miyazaki, Miyamae-ku, Kawasaki 213, Japan
H. Igarashi
Affiliation:
Fundamental Research Laboratories, NEC Corporation 4–1–1 Miyazaki, Miyamae-ku, Kawasaki 213, Japan
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Abstract

Tc variations observed in some Tl-based superconductors were studied. Clear correlations were found between Tc, carrier concentration, and c-axis length. In particular, for Tl2Ba2CuO6, a decrease in oxygen content of about 0.1 per formula unit, which corresponded to a decrease in hole concentration of about 0.2, increased Tc up to about 80K from a metallic non-superconductor, and elongated the c axis by about 0.4%. In addition, as Tc values increased systematic changes in metal-sheet separations were observed. Tc variations caused by a change in oxygen content were also observed in Tl2Ba2CaCu2O8 and Tl2Ba2Ca2Cu3O10. It was demonstrated that superconductivity appears in a certain appropriate range of carrier concentration similar to those observed in other high-Tc superconductors.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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References

1 Sheng, Z.Z. and Hermann, A.M., Nature 332, 55 (1988).Google Scholar
2 Sheng, Z.Z. and Hermann, A.M., Nature 332, 138 (1988).Google Scholar
3 Shimakawa, Y. et al. , Physica C156,97 (1988).Google Scholar
4 Subramanian, M.A. et al. , Nature 332,420 (1988).Google Scholar
5 Parkin, S.S.P. et al. , Phys. Rev. Lett. 60,2539 (1988).Google Scholar
6 Torardi, C.C. et al. , Phys. Rev. B38,225 (1988).Google Scholar
7 Kondoh, S. et al. , Solid State Comm. 65,1329 (1988).Google Scholar
8 Shimakawa, Y. et al. , Proc. ISS'88(Springr-Verlag,Tokyo,1989)p.781.Google Scholar
9 Shimakawa, Y. et al. , Physica C157,279 (1989).Google Scholar
10 Shimakawa, Y. et al. , to be publised in Phys.Rev.B.Google Scholar
11 Manako, T. et al. , Physica C158,143(1989).Google Scholar
12 Izumi, F., J. Crystallogr. Soc. Jpn. 27,23 (1985).Google Scholar
13 Kubo, Y. et al. , Jpn. J. Appl. Phys. 26, L768 (1987).Google Scholar
14 Kubo, Y. et al. , Proc. M2S-HTSC(to be publised in Physica C).Google Scholar
15 Kubo, Y. et al. , Proc. ISS'89 (to be published).Google Scholar
16 J.B. Torrance, et al. , Phys. Rev. Lett. 61,1127 (1988).Google Scholar
17 Takagi, H. et al. , Phys. Rev. B40,2254 (1989).Google Scholar
18 Parise, J.B. et al. , Physica C159,239 (1989).Google Scholar