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The use of Rheed Intensities for the Quantitative Characterization of Surfaces

Published online by Cambridge University Press:  21 February 2011

Y. Ma ,
S. Lordi  and
J. A. Eades
Y. Ma
Affiliation:
Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801-2985.
S. Lordi
Affiliation:
Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801-2985.
J. A. Eades
Affiliation:
Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801-2985.
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Abstract

RHEED is an important method for the in situ characterization of surfaces. Until recently, this characterization has not used the intensities of RHEED reflections. Improved methods of calculation have made it possible to simulate RHEED patterns from bulk-terminated, reconstructed and stepped surfaces. From the comparison between simulated and experimental patterns, it is now possible to refine the positions of atoms in surfaces and to determine the density of steps on surfaces (well almost).

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 399: Symposium D – Evolution of Epitaxial Structure and Morphology , 1995 , 3
Copyright
Copyright © Materials Research Society 1996

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References

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