Hostname: page-component-cd9895bd7-jn8rn Total loading time: 0 Render date: 2024-12-27T17:01:33.094Z Has data issue: false hasContentIssue false

Two-dimensional electron gas scattering mechanisms in AlGaN/GaN heterostructures

Published online by Cambridge University Press:  17 March 2011

E. Borovitskaya
Affiliation:
Dept. of ECSE and CIEEM, Rensselaer Polytechnic Institute, USA
W. Knap
Affiliation:
Dept. of ECSE and CIEEM, Rensselaer Polytechnic Institute, USA
M. S. Shur
Affiliation:
Dept. of ECSE and CIEEM, Rensselaer Polytechnic Institute, USA
R. Gaska
Affiliation:
Also with Sensor Electronic Technology, Latham, NY 12110, USA
E. Frayssinet
Affiliation:
CNRS-CRHEA, France
P. Lorenzini
Affiliation:
CNRS-CRHEA, France
N. Grandjen
Affiliation:
CNRS-CRHEA, France
B. Baumont
Affiliation:
CNRS-CRHEA, France
J. Massies
Affiliation:
CNRS-CRHEA, France
C. Skierbiszewski
Affiliation:
High Pressure Research Center, UNIPRESS, Poland
P. Prystawko
Affiliation:
High Pressure Research Center, UNIPRESS, Poland
M. Leszczynski
Affiliation:
High Pressure Research Center, UNIPRESS, Poland
I. Grzegory
Affiliation:
High Pressure Research Center, UNIPRESS, Poland
S. Porowski
Affiliation:
High Pressure Research Center, UNIPRESS, Poland
Get access

Abstract

We present the results of the experimental and theoretical studies of the low field mobility of two-dimensional electrons in the homoepitaxial AlGaN/GaN heterostructures and in the AlGaN/GaN heterostructures grown on SiC. We show that, at cryogenic temperatures, the temperature dependence of the mobility is primarily determined by the deformation potential scattering and that most of other important scattering mechanisms are temperature independent. We show also that two-dimensional (2D) and three-dimensional (3D) mobility models yield very close results. The analysis of the mobility dependence on the electron sheet density ns shows two possible explanations of the non monotonic mobility versus carrier density dependence: i) the alloy/interface scattering and ii) transfer of the 2D electrons into 3D states in GaN. We present experimental data suggesting that for high 2D gas densities in the investigated structure grown on SiC the 2D-3D transition should take place and might be responsible for the mobility decrease at high electron sheet densities.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Shur, M. S., Gelmont, B. and Khan, M. A., J. Electronic Materials, 25, 777 (1996).Google Scholar
2. Walukiewicz, W., Ruda, H.E., Lagowski, J., and Gatos, H.C., Phys. Rev. B, 30, 4571 (1984).Google Scholar
3. Smorchkova, I. P., Elsass, C. R., Ibbetson, J. P., Vetury, R., Heying, B., Fini, P., Haus, E., DenBaars, S. P., Speck, J. S. and Mishra, U. K., J. Appl. Phys., 86, 4520 (1999).Google Scholar
4. Frayssinet, E., Knap, W., Lorenzini, P., Grandjean, N., Massies, J., Skierbiszewski, C., Suski, T., Grzegory, I., Porowski, S., Simin, G., Hu, X., Khan, M.A., Shur, M.S., Gaska, R., Maude, D., Appl. Phys. Lett. 77, 2551 (2000).Google Scholar
5. Gaska, R., Wang, J. W., Osinsky, A., Chen, Q., Khan, M. Asif, Orlov, A. O., Snider, G. L. and Shur, M. S., Appl. Phys. Lett. 72, 707 (1998)Google Scholar
6. Knap, W. et al. 2000 MRS Fall Meeting, Boston, MA, 2000 Google Scholar
7. , Gaska, Shur, M. S., Bykhovski, A., Orlov, A. O., Snider, G. L., Appl. Phys. Lett. 74, 287 (1999)Google Scholar
8. Hsu, L. and Walukiewicz, W., Phys. Rev. B 56, 1520 (1997)Google Scholar
9. Levinshtein, M. E., Rumyantsev, S. L., Shur, M. S., Properties of Advanced Semiconductor Materials GaN, AlN, InN, BN, SiC, SiGe (World Scientific, 2000).Google Scholar